Gentlemen: I apologize for the length of this dissertation, but I hope it may clear up a few seemingly disparate positions opined by others earlier, as well as stimulate some more in-depth thought. As pointed out earlier, ESD is a complex phenomena to model. The results and impacts observed will be radically different depending on the initial charge voltage, rates of closure between the arc points, and total physical structure/configuration of the two participating "bodies" involved. That being acknowledged, about four years ago, I attended an EMC Society presentation (Santa Clara, CA, sorry, don't recall who presented) where multiple, carefully planned and conducted ESD test results were presented. The test items were enclosed in a shielded enclosure to minimize coupling (false) effects on the high-speed oscilloscope probes and cables. The most enlightening findings were that the lower voltages (4k-8k volts) produced rise times in the few picoseconds range (yes, picoseconds). The higher voltages (30k-50k volts) produced much slower rise times (a factor of ~10 as I recall), probably because of the longer and more lossy arc path associated with these voltages. The higher voltage arcs contained significantly more energy (1/2*C*V^2) and were delivered through a longer (higher inductance) and more resistive path; therefore, slower rise times, longer discharge durations, and correspondingly lower frequency content were observed for these strikes before the arc quenched. Bottom line: It is nonsense if one does NOT think that many (lower voltage) ESD events do not contain GHz frequency content with all its negative interference effects. Conversely, very strong low frequency energy content will be observed in higher voltage ESD events. The latter case has particularly nasty magnetic coupling affects. THE FIX: Unfortunately, there is no single magic bullet of design techniques for the wide range of ESD strike characteristics. However, I have achieved considerable success using multiple-layer, via-interconnected (staggered via spacings), chassis ground rings on the periphery of printed circuit boards (PCBs). I have even used sharp points on the outboard edges of the rings to offer "preferred" ESD strike points to protect PCB operational circuits from taking the hit. Some members of the SI List have scoffed at chassis ground rings (which I introduced in 1989 with no prior knowledge that anyone else was using same); therefore, you are free to dissent with me on their value. And clearly, their use in fully enclosed assemblies (as opposed to portable equipment or open enclosure "windows") is not normally necessary as such packaging is not conducive to ESD strike conditions. HOWEVER... My concept for the use of ground rings includes the provision of a low impedance current path isolated from and surrounding the main PCB circuits. This represents a sacrificial intercepting structure that will divert the primary current flow from an ESD strike via the lowest impedance path (always preferred in the natural world) to the main structure, and then to earth. Further, the nature of the surrounding ring tends to divide the strike current so that a 180 degree phase relationship for the resulting strong magnetic fields is created. Circuits that are a few centimeters away experience canceling magnetic fields from the two segments of the ESD current. The circuits on each side of and more near the strike point edge still experience strong fields, but they are reduced (as a minimum) in proportion to the division of strike current flow in the opposite directions along the chassis ground rings; i.e., by at least 6 dB. Other ESD hardening techniques that should be considered in conjunction with the use of chassis ground rings include (a) using buried/stripline traces, (b) NOT routing critical traces along PCB edges (on any layer), and (c) maintaining a continuous signal ground (generally part of a plane) around the PCB periphery (isolated from the chassis ground ring). For superior performance, the ground plane should be tightly coupled to the power plane(s) as well. In my experience on redesigns of deficient PCBs where I incorporated the above noted features, the chassis ground ring structure demonstrated a diversion of at least 95% (typically >=99%) of the ESD energy away from the operational PCB circuits. Item (a) inherently provides shielding generally in excess of 20 dB. Item (b) minimizes any E- and H-field coupling to the trace through spacing. Item (c) will absorb coupled energy in a manner that presents common-mode voltage to the PCB circuits which then tends to be rejected. This result depends on the tight power/ground plane coupling noted earlier, which is why I also strongly urge the use of buried capacitance (BC) power distribution designs. Note also that the magnetic coupling in item (c) will tend to cancel in proportion to the ESD directional/opposite current division in the chassis ground rings; therefore, the coupling mechanism is primarily via capacitively coupled E-field between the rings and the ground plane. Note also that the multiple paralleled chassis ground rings provide a very low impedance (both low inductance and low resistance) to the ESD current, thereby minimizing the E-field strength. All of the above contributes to the robustness of a given design. As a further effect that has not been fully understood (or publicized), the use of BC planes is very beneficial in extending the common-mode voltage coupling characteristic of item (c) out to very high frequencies (GHz region). Hence, BC provides reduced circuit susceptibility to ESD events even into the multi-GHz region. GENERAL COMMENTS: Most PCB designs have unique physical and electrical characteristics; therefore, every Engineer/Designer should think for themselves as to the design risk/environment for ESD and think out the proper mitigation techniques. One should know WHY a specific technique is used based on electromagnetic principles. If one cannot understand the WHY, more education is required, or another vocation is in order. And lastly, please note that many design techniques are supportive to other techniques. If one designs for critical applications (space systems, military, life-threatening, and other man-rated systems as I do), it is better to initially design in extra margins of safety through the use of several complementary techniques, and then (when successful) look to the second generation design for value/cost-engineering modifications. Respectfully, Mike Michael L. 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