Hi Pete: I totally agree with Paul's suggestion,you should use a independent regulator and use outer layer P/G plane pair to reduce the inductance of the PDN loop in your case, and I have some additional comment for your reference. Consider the test setup you use,it is unavoidable to have large noise on the VTT rail, you can reduce ,but can't eliminate the noise , cause we have no such ideal PDN to offer such rush current. What we should really care is the eye diagram of the signal,include the add/cmd/dq/clk, it should be the final spec to decide if our VTT power design meet the requirement. If you find problems in the ADD/CMD eye diagram too,them you can: Besides N Paul's suggestions, addition 100uF bulk caps may be needed to lower the noise. Each VTT resistor should have a decap capacitor, 100n/1uF , 0402 size. Again, route the VTT plane on top or bottom side( same size with your regulator placement), with a GND adjacent.Inductance is important, so try to reduce the distance between the voltage regulator and VTT resistor. Increase the VTT resistor value, 39 ohm is not a good choice at this case. Reduce the current of the driver ,of add series resistor, based on your simulation. By the way , do we really need a all 0 to all 1 test pattern for the address signal? Regards, LIU Luping ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List forum is accessible at: http://tech.groups.yahoo.com/group/si-list List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu