But yet you didn't ... why? You make a lot of claims and you have a scalable
EM model, but you create an SBR that has precursor noise. Doesn't make sense.
Scott McMorrow, CTO Signal Integrity Group
Samtec
Office 401-284-1827 | +1-800-726-8329
www.samtec.com
-----Original Message-----
From: C.C. Hwang [mailto:cchwang2013@xxxxxxxxx] ;
Sent: Wednesday, May 24, 2017 9:01 PM
To: Scott McMorrow <Scott@xxxxxxxxxxxxx>
Cc: jose.moreira@xxxxxxxxxxxxx; johnlinc@xxxxxxxxx; si-list
<si-list@xxxxxxxxxxxxx>
Subject: Re: [SI-LIST] Re: Differential vs. SE for PCB Dk/Df extraction
Hi Scott,
We used a small rise time (10 ps). The ripples are due to S-param bandwidth
limitation. To compare with original data, we zeroed out S-param above 40GHz
when we took FFT. To reduce the ripples, we could have used the newly created
model that was good to any frequency.
Regards,
Ching-Chao Huang
On Wed, May 24, 2017 at 5:41 PM, Scott McMorrow <Scott@xxxxxxxxxxxxx> wrote:
C.C. in your document http://www.ataitec.com/PDF/MPX.pdf, showing the ;------------------------------------------------------------------
capability of your method, on slide 24 why is the SBR non-causal with
precursor ripple? Is this an issue with your 2D solver?
Scott McMorrow, CTO Signal Integrity Group Samtec Office 401-284-1827
| +1-800-726-8329 www.samtec.com
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx
[mailto:si-list-bounce@xxxxxxxxxxxxx] On Behalf Of Scott McMorrow
Sent: Tuesday, May 23, 2017 8:10 AM
To: jose.moreira@xxxxxxxxxxxxx; johnlinc@xxxxxxxxx; si-list
<si-list@xxxxxxxxxxxxx>
Subject: [SI-LIST] Re: Differential vs. SE for PCB Dk/Df extraction
Jose
Traces are actually great for Dk/Df/Cu Roughness extraction. Yuriy and I
have written many papers on the process and the results.
Resonant structures, such as a Beatty resonator are fine for verification
checks, but are too narrow band for fine discernment of how to apportion
attenuation between Df and Cu Conductivity/Roughness.
Scott McMorrow, CTO Signal Integrity Group Samtec Office 401-284-1827
| +1-800-726-8329 www.samtec.com
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx
[mailto:si-list-bounce@xxxxxxxxxxxxx] On Behalf Of Moreira, Jose
Sent: Tuesday, May 23, 2017 4:36 AM
To: johnlinc@xxxxxxxxx; si-list <si-list@xxxxxxxxxxxxx>
Subject: [SI-LIST] Re: Differential vs. SE for PCB Dk/Df extraction
In my opinion differential or single-ended makes no difference for Dk/Df
extraction. Important is the kind of structure you use. A simple trace is not
a good structure. I suggest a resonant standard like a Beatty Standard.
Check the Designcon 2018 paper "Non-Destructive Analysis and EM Model Tuning
of PCB Signal Traces using the Beatty Standard"
Jose
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx
[mailto:si-list-bounce@xxxxxxxxxxxxx] On Behalf Of John Lin
Sent: Dienstag, 23. Mai 2017 05:53
To: si-list <si-list@xxxxxxxxxxxxx>
Subject: [SI-LIST] Differential vs. SE for PCB Dk/Df extraction
Hi SI gurus,
While using VNA to measurement traces on PCB for loss and Dk/Df extraction,
my colleagues say the differential handhold probe head can have wider
bandwidth than single ended handhold probe head. Is it true?
Can someone help to explain the reasons?
Also, for Dk/Df extraction, which is better structure, using single ended or
differential traces? Why?
Thank you for helps in advance.
Thanks,
John Lin
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