[SI-LIST] Re: TDR S-parameter and correlation
- From: David Instone <dave.instone@xxxxxxxxxx>
- To: Chris.Cheng@xxxxxxxx
- Date: Fri, 31 Aug 2007 09:42:57 +0100
I have a feeling they can't handle branched topologies either.
Regards
Dave Instone
+44 (0)1235 824963
OXFORD SEMICONDUCTOR LIMITED
25 MILTON PARK
ABINGDON
OXFORDSHIRE
OX14 4SH
Registered in England no 2733820
Registered Address: As above
Chris Cheng wrote:
> Layer peeling algorithm gets interesting when your discontinuities are =
> diverse and different and reflections start to bounce around.
>
> -----Original Message-----
> From: si-list-bounce@xxxxxxxxxxxxx
> [mailto:si-list-bounce@xxxxxxxxxxxxx]On Behalf Of ronald miller
> Sent: Thursday, August 30, 2007 1:22 PM
> To: zhenggang.cheng@xxxxxxxxx
> Cc: si-list
> Subject: [SI-LIST] Re: TDR S-parameter and correlation
>
>
> Content-Type: text/plain; charset=3Dus-ascii; format=3Dflowed
> Content-Transfer-Encoding: 7bit
> Hi Zhenggang
>
> Apparently, you are working on S-Parameter data converted from TDR.
> If you want to use S-Parameters as your model for simulation it is=20
> reasonably accurate.
>
> A much simpler method is avaiable using ADS.
> Convert the TDR data to a time/amplitude columns vs Time
> Import the data into ADS
> Model the circuit using transmission line elements with Frequency=20
> Dependent Loss
> View the measured TDR and simulated TDR on the same screen
> Adjust the parameters of the ADS models and simulate
> Continue adjusting the parameters unti the model matches the=20
> measrued TDR
>
> This provides a model that cannot be faulted.
>
> So then the eye pattern can be easily simulated with accurate models.
>
> Ron
>
>
>
> Once this is done
>
> ZHENGGANG CHENG wrote:
>
>
>> Hi,
>> My question is:
>>
>> If we TDR (assuming the TDR method is 100% correct) the equivalent =
>>
> circuit
>
>> converted using S-parameter, will the result is exactly the same as =
>>
> real TDR
>
>> of the same DUT? (assume the converting error and bandwidth are not =
>>
> issues)
>
>> Assume this DUT has many large discontinuities inside.
>>
>> To me, the real TDR can distinguish all the discontinuities inside a =
>>
> DUT;
>
>> however, the S-parameter is only the characterization at the ports =
>>
> rather
>
>> than inside. Will two equivalent circuits give the same S-parameter but =
>>
> have
>
>> two different topologies?
>>
>> Look froward to your replies.
>>
>> Thanks,
>>
>> ZG
>>
>>
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>
> --=20
> Ronald Miller
> Ghz Data, Signal Integrity Consulting
> 7721 Sunset Ave.
> Newark CA 94560
> tel 510-793-4744
> cell 510-377-9380
> fax 510-742-6686
> www.ghzdata.com
>
>
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>
> -- Binary/unsupported file stripped by Ecartis --
> -- Type: application/msword
> -- File: Copy of Models Optimized to TDR.doc
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> -- Binary/unsupported file stripped by Ecartis --
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> -- File: Simulation Waveforms Typical system.doc
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- References:
- [SI-LIST] Re: TDR S-parameter and correlation
- From: Chris Cheng
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- [SI-LIST] Re: TDR S-parameter and correlation
- From: Chris Cheng