[SI-LIST] Re: TDR S-parameter and correlation

  • From: David Instone <dave.instone@xxxxxxxxxx>
  • To: Chris.Cheng@xxxxxxxx
  • Date: Fri, 31 Aug 2007 09:42:57 +0100

I have a feeling they can't handle branched topologies either.

Regards
Dave Instone
+44 (0)1235 824963

OXFORD SEMICONDUCTOR LIMITED
25 MILTON PARK
ABINGDON
OXFORDSHIRE
OX14 4SH
Registered in England no 2733820
Registered Address: As above 



Chris Cheng wrote:
> Layer peeling algorithm gets interesting when your discontinuities are =
> diverse and different and reflections start to bounce around.
>
> -----Original Message-----
> From: si-list-bounce@xxxxxxxxxxxxx
> [mailto:si-list-bounce@xxxxxxxxxxxxx]On Behalf Of ronald miller
> Sent: Thursday, August 30, 2007 1:22 PM
> To: zhenggang.cheng@xxxxxxxxx
> Cc: si-list
> Subject: [SI-LIST] Re: TDR S-parameter and correlation
>
>
> Content-Type: text/plain; charset=3Dus-ascii; format=3Dflowed
> Content-Transfer-Encoding: 7bit
> Hi Zhenggang
>
> Apparently, you are working on S-Parameter data converted from TDR.
> If you want to use S-Parameters as your model for simulation it is=20
> reasonably accurate.
>
> A much simpler method is avaiable using ADS.
>     Convert the TDR data to a time/amplitude columns vs Time
>     Import the data into ADS
>     Model the circuit using transmission line elements with Frequency=20
> Dependent Loss
>     View the measured TDR and simulated TDR on the same screen
>     Adjust the parameters of the ADS models and simulate
>     Continue adjusting the parameters unti the model matches the=20
> measrued TDR
>
> This provides a model that cannot be faulted.
>
> So then the eye pattern can be easily simulated with accurate models.
>
> Ron
>
>
>
> Once this is done
>
> ZHENGGANG CHENG wrote:
>
>   
>> Hi,
>> My question is:
>>
>> If we TDR  (assuming the TDR method is 100% correct) the equivalent =
>>     
> circuit
>   
>> converted using S-parameter, will the result is exactly the same as =
>>     
> real TDR
>   
>> of the same DUT? (assume the converting error and bandwidth are not =
>>     
> issues)
>   
>> Assume this DUT has many large discontinuities inside.
>>
>> To me, the real TDR can distinguish all the discontinuities inside a =
>>     
> DUT;
>   
>> however, the S-parameter is only the characterization at the ports =
>>     
> rather
>   
>> than inside. Will two equivalent circuits give the same S-parameter but =
>>     
> have
>   
>> two different topologies?
>>
>> Look froward to your replies.
>>
>> Thanks,
>>
>> ZG
>>
>>
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>> =20
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>>     
>
> --=20
> Ronald Miller
> Ghz Data, Signal Integrity Consulting
> 7721 Sunset Ave.
> Newark CA  94560
> tel   510-793-4744
> cell  510-377-9380
> fax   510-742-6686
> www.ghzdata.com
>
>
>
>
> -- Binary/unsupported file stripped by Ecartis --
> -- Type: application/msword
> -- File: Copy of Models Optimized to TDR.doc
>
>
> -- Binary/unsupported file stripped by Ecartis --
> -- Type: application/msword
> -- File: Simulation Waveforms Typical system.doc
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