[SI-LIST] TDR S-parameter and correlation

  • From: "ZHENGGANG CHENG" <zhenggang.cheng@xxxxxxxxx>
  • To: si-list <si-list@xxxxxxxxxxxxx>
  • Date: Thu, 30 Aug 2007 12:30:19 -0700

My question is:

If we TDR  (assuming the TDR method is 100% correct) the equivalent circuit
converted using S-parameter, will the result is exactly the same as real TDR
of the same DUT? (assume the converting error and bandwidth are not issues)
Assume this DUT has many large discontinuities inside.

To me, the real TDR can distinguish all the discontinuities inside a DUT;
however, the S-parameter is only the characterization at the ports rather
than inside. Will two equivalent circuits give the same S-parameter but have
two different topologies?

Look froward to your replies.



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