[SI-LIST] TDR S-parameter and correlation

Hi,
My question is:

If we TDR  (assuming the TDR method is 100% correct) the equivalent circuit
converted using S-parameter, will the result is exactly the same as real TDR
of the same DUT? (assume the converting error and bandwidth are not issues)
Assume this DUT has many large discontinuities inside.

To me, the real TDR can distinguish all the discontinuities inside a DUT;
however, the S-parameter is only the characterization at the ports rather
than inside. Will two equivalent circuits give the same S-parameter but have
two different topologies?

Look froward to your replies.

Thanks,

ZG


------------------------------------------------------------------
To unsubscribe from si-list:
si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field

or to administer your membership from a web page, go to:
http://www.freelists.org/webpage/si-list

For help:
si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field


List technical documents are available at:
                http://www.si-list.net

List archives are viewable at:     
                http://www.freelists.org/archives/si-list
or at our remote archives:
                http://groups.yahoo.com/group/si-list/messages
Old (prior to June 6, 2001) list archives are viewable at:
                http://www.qsl.net/wb6tpu

Other related posts: