[SI-LIST] Re: Common Clock and Source Synchronous Timing Margins
- From: Itzhak Hirshtal <hirshtal@xxxxxxxxxxxxx>
- To: "si-list@xxxxxxxxxxxxx" <si-list@xxxxxxxxxxxxx>
- Date: Sun, 27 Jan 2002 13:48:23 +0200
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Todd,
Thanks.
See below my follow-up question.
Todd Westerhoff wrote:
> Hi all,
>
> There were a lot of parts to this thread, but I wanted to comment on:
>
> (5) The Interconnectix (ICX) simulator also provides a means for
> automatically compensating for the load difference between the test load and
> the actual PCB trace load.
>
> >> I think most, if not all, of the IBIS simulators have this capability.
> The different vendors give it different names and have somewhat different
> options, but it's basically the same concept with different implementation
> details.
>
> But this method depends, of course, on the manufacturer to supply the
> appropriate test load parameters. Since the IBIS model, on which ICX
> simulations are based, assumes a certain configuration of test capacitance
> and resistance, this presents a problem where the manufacturer uses a
> different configuration. For example, I encountered a manufacturer who
> claimed he used a current-source test load, with a different current load
> for the high and low states of the tested outputs. I had to use
> approximations in order to be able to simulate these outputs using an IBIS
> model. Has anyone encountered such a problem and have a solution?
>
> >> First and foremost, you're doing the right thing, and that is paying
> close attention to the correlation between the manufacturer's spec and
> what's in the IBIS model. The situation you describe is one common problem,
> spec'ing a high speed part into a large capacitive (lumped) load is another
> common one.
>
> >> For your specific case, the easiest solution may be to disable the
> simulator's buffer delay adjustment and report the raw data instead. You
> then simulate the different test load conditions individually, determine the
> adjustment factor for each case and adjust the raw data in whatever manner
> you like (as in, Excel). Alternatively, some tools allow you to load the
> delay adjustments into the library directly, and use these values to perform
> the correction.
>
>> Actually, I'm not sure how to understand your advice, as related to my
specific problem. Can you elaborate a little?
> >> The base problem you identified - limitations of the existing IBIS spec
> in specifying test loads, is, I believe, a recognized issue.
>
> Hope that helps,
>
> Todd.
>
> Todd Westerhoff
> SI Engineer - Hammerhead Networks
> 5 Federal Street - Billerica, MA - 01821
> email:twester@xxxxxxxxxxx - ph: 978-671-5084
> ============================================
>
> "Oh, but ain't that America, for you and me
> Ain't that America, we're something to see
> Ain't that America, Home of the Free
> Little pink houses, for you and me"
>
> - John Mellencamp
>
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--
Itzhak Hirshtal
Elta Electronics
POB 330 Ashdod
Israel 77102
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email: hirshtal@xxxxxxxxxxxxx
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- References:
- [SI-LIST] Re: Common Clock and Source Synchronous Timing Margins
- From: Todd Westerhoff
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- » [SI-LIST] Re: Common Clock and Source Synchronous Timing Margins
- [SI-LIST] Re: Common Clock and Source Synchronous Timing Margins
- From: Todd Westerhoff