Hi all, Thanks for your clear explanations! I have another interesting question about my hspice simulation deck for simulating the TDR Z (differential) profile (vs time): The Z profile in the sim deck is defined as (V(t)_p - V(t)_n)/I(t). V(t)_p is probed at the point right after source impedance (50ohms) for positive lane, and V(t)_n is probed at the point right after source impedance (50ohms) for negative lane. The source is a step voltage source connecting p and n lanes. It seems, sometimes my simulated Z profile can be very close to measurements, but sometimes it is not, especially for DUT with many large discontinuities inside. I am wondering if (V(t)_p - V(t)_n)/I(t) is sufficient and correct to represent the real TDR Z profile? Look forward to your explanations. Thanks. ZG 2007/8/31, Loyer, Jeff <jeff.loyer@xxxxxxxxx>: > > If the S-parameters are identical, then the TDR/TDT results will likewise > be identical (assuming proper risetime to match the frequency limit of the > S-parameters). > > But you have to remember that the phase of S-parameters are just as > critical as the magnitude (in evaluating the circuit). Often we only > focus on the magnitude, and forget the phase. > > Another caveat is that we tend to concentrate on S21, which is the > frequency equivalent of TDT. This can be very similar for different > networks, even though S11 (and TDR) are dramatically different. > > I believe these 2 factors add up to make it appear that very > differentcircuits have the same S-parameters: you > might only be looking at S21 magnitude, when you should be looking at the > magnitude and phase of S11, and phase of S21 also. > > You might look at some work Cherry Wakayama did, comparing S-parameters > derived from VNA vs. TDR/TDT measurements (see link below). There were > several very different structures, and the S-parameters varied > accordingly, especially when you look at phase and S11, not just the magnitude > of S21. > > * > http://www.tek.com/products/oscilloscopes/sampling/interconnect_analysis/customer_papers/vna_tdr_correlation.pdf > *<http://www.tek.com/products/oscilloscopes/sampling/interconnect_analysis/customer_papers/vna_tdr_correlation.pdf> > > Unfortunately, we didn't include the original TDR waveforms in the paper, > but they contained all kinds of various "bumps" in them before being > converted to S-parameters. > > P.S. - I'd also like to thank Vladimir for his great explanation. > > Jeff Loyer > > -----Original Message----- > From: si-list-bounce@xxxxxxxxxxxxx > [mailto:si-list-bounce@xxxxxxxxxxxxx<si-list-bounce@xxxxxxxxxxxxx>] > On Behalf Of ZHENGGANG CHENG > Sent: Thursday, August 30, 2007 4:15 PM > To: vladimir_dmitriev-zdorov@xxxxxxxxxx; si-list@xxxxxxxxxxxxx > Subject: [SI-LIST] Re: FW: TDR S-parameter and correlation > > > > > > Vladimir, > > Thanks for your detailed explanations. > > I still have a question, since many topologyies can produce the same > > S-parameters, the real TDR of these equivalent circuits with different > > topologies would still be the same? TDR can see the characteristic > > impedance discontinuities inside the circuits in terms of delay/flight > time. > > I thought the different topologies would give different TDR restults. > > ZG > > -----Original Message----- > > > From: si-list-bounce@xxxxxxxxxxxxx > > [mailto:si-list-bounce@xxxxxxxxxxxxx<si-list-bounce@xxxxxxxxxxxxx> > ] > > > On Behalf Of Dmitriev-Zdorov, Vladimir > > > Sent: Thursday, August 30, 2007 3:03 PM > > > To: si-list@xxxxxxxxxxxxx > > > Subject: [SI-LIST] TDR S-parameter and correlation > > > > > > > > > Hi ZHENGGANG, > > > > > > > > > > > > As I understand, the issue is about "general type" model, not just a > > > segment of T-line. > > > > > > > > > > > > The answer to your first question is YES provided that (a) DUT's > > > S-parameters were measured correctly, (b) the equivalent circuit is > > > correctly built from S-parameters and (c) the way you assign ports in > > > your equivalent circuits is consistent with how the measurements was > > > done. > > > > > > > > > > > > Topology cannot be uniquely derived from S (or Y/Z/G/H... etc.) > > > parameters unless you have it predefined, like in case of T-line. There > > > could be many circuits with quite different topology producing the same > > > S/Y/Z... parameters. > > > > > > > > > > > > Yes, S-parameters only characterize the model from outside ports, but > > > this is exactly what other pieces of your design see from this model: > > > this is sufficient to use the model in many simulation procedures, > > > unless you are interested in voltages/currents inside the model itself. > > > > > > > > > > > > The problems above named (b) and (c) are sometimes not well understood. > > > > > > > > > > > > First of all, any measured S-parameters (think of touchstone file) > > > contain the data in a limited frequency range, while any equivalent > > > circuit is 'defined' from DC to infinite frequency. Hence, they cannot > > > be equivalent if S-parameters do not cover sufficiently wide range of > > > frequencies, presumably from the lowest frequency where they start > > > changing up to the highest frequency where they stop changing and > > > approach to constant level. In all other cases, be prepared that the > > > circuit does not accurately capture the model behavior at very low and > > > high frequencies. Building equivalent circuit requires rational > > > polynomial fitting. This may be done by different tools with different > > > accuracy. In many cases, passivity enforcement is required on the post > > > fit stage to prevent unstable model behavior, especially if the upper > > > frequency in touchstone data is not sufficient. "Passivation" adds some > > > inaccuracy to the fitted model. Typically, representing the > > > poles/residues with circuit elements does not bring much error. These > > > are main sources of discrepancy we may have between given S-parameters > > > and equivalent circuit. Plus, time domain simulation of the equivalent > > > circuit, performed with finite resolution, adds LTE (local truncation > > > error). > > > > > > > > > > > > The problem (c) may sometimes be insidious. Imagine the S-parameters of > > > DUT were measured for two ports, without a 'common' ground. Essentially, > > > these measurements only characterize how the wave may propagate between > > > these two ports. Then, an equivalent circuit was built with four > > > external nodes making two ports. Now, someone use this model not only by > > > apply input to the first port and measure output at the second, but also > > > making arbitrary connections between any of external nodes of this > > > model. The result: behavior inconsistent with the original device. (Same > > > also possible with common ground). That is, we need to make sure the > > > model is used the same way the measurements were done for S-parameters. > > > > > > > > > > > > Vladimir > > > > > > > > > > > > > > > > > > > > > > > > Msg: #15 in digest > > > > > > Date: Thu, 30 Aug 2007 12:30:19 -0700 > > > > > > From: "ZHENGGANG CHENG" <zhenggang.cheng@xxxxxxxxx> > > > > > > Subject: [SI-LIST] TDR S-parameter and correlation > > > > > > > > > > > > Hi, > > > > > > My question is: > > > > > > > > > > > > If we TDR (assuming the TDR method is 100% correct) the equivalent > > > circuit converted using S-parameter, will the result is exactly the same > > > as real TDR of the same DUT? (assume the converting error and bandwidth > > > are not issues) Assume this DUT has many large discontinuities inside. > > > > > > > > > > > > To me, the real TDR can distinguish all the discontinuities inside a > > > DUT; however, the S-parameter is only the characterization at the ports > > > rather than inside. Will two equivalent circuits give the same > > > S-parameter but have two different topologies? > > > > > > > > > > > > Look froward to your replies. > > > > > > > > > > > > Thanks, > > > > > > > > > > > > ZG > > > > > > > > > > > > > > > > > > > > > > > > > > > ------------------------------------------------------------------ > > > To unsubscribe from si-list: > > > si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field > > > > > > or to administer your membership from a web page, go to: > > > //www.freelists.org/webpage/si-list > > > > > > For help: > > > si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field > > > > > > > > > List technical documents are available at: > > > http://www.si-list.net > > > > > > List archives are viewable at: > > > //www.freelists.org/archives/si-list > > > or at our remote archives: > > > http://groups.yahoo.com/group/si-list/messages > > > Old (prior to June 6, 2001) list archives are viewable at: > > > http://www.qsl.net/wb6tpu > > > > > > > > > > > > > ----------------------------------------------------------------------------------- > > > This email message is for the sole use of the intended recipient(s) and > > > may contain > > > confidential information. 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