[SI-LIST] Re: Virus Attachments?
- From: "Mike LaBonte" <milabont@xxxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Fri, 13 Jun 2003 11:07:09 -0400
A posting with PE_BUGBEAR.B came in today on the '[SI-LIST] Re: Why we need
to use "Series resistor" at Transmitter' thread, but our mail server caught
it on the way in. Since I administer another freelists.org list that does
not allow attachments, I was curious mostly to know how this attachment got
through the reflector. A look at the headers shows that it did not go
through the reflector, but straight to me! This virus has a reputation for
sophisticated ways of finding email addresses to send itself to.
Mike
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]On
Behalf Of Jon Powell
Sent: Friday, June 13, 2003 10:29 AM
To: jonpowell@xxxxxxxxxxxx; cycheng@xxxxxxxxxxxxxx; si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Virus Attachments?
I have received another email supposedly from the SI-LIST with a very
suspiciuos attachment. Are other people getting these? Attachments are
supposed to be deleted by the reflector, so I think fellow Si-Listers should
be very careful about this.
Jon
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]On
Behalf Of Jon Powell
Sent: Friday, June 13, 2003 7:12 AM
To: cycheng@xxxxxxxxxxxxxx; si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: How do we choose the proper test load?
If your goal is to use a static (or other) timing evaluator that uses models
based on the time delay of the parts in the databook, then it is important
that your SI measurement for test load be the same as the one used in the
databook for definition of time delay through the part.
What you are actually trying to do is remove the driving of the test load
from the equation to avoid double counting of that part of the delay.
jon
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]On
Behalf Of C.Y. Cheng
Sent: Friday, June 13, 2003 4:08 AM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] How do we choose the proper test load?
Dear list members,
I am confusing how to choose a proper test load for the timing evaluation.
In the book��High- speed digital system design�� page 204. There is an
example:
�� An output buffer with an edge speed of 300ps is driving a transmission
line with a C11 of 2.5pF/inch. And propagation delay of 150ps/in., the edge
would encompass 2 in. or 5pF. Subsequently, a good load in this case would
be 5pF.��
In this case, does the loading of receiver need to be considered to evaluate
the Tco if the trace length less than 2 inches?
This often asked by the logic designer. A capacitor often set at output pin
to extract timing for static timing analysis. The trace length in this case
may vary from 0.5 inch to 6 inches or more. How do we choose the test load
to cover all the case?
=================================
C.Y. Cheng
System Design Engineer
Realtek Semiconductor Corp.
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