[SI-LIST] R: Rogers4003 Board Characterization
- From: <gianguida@xxxxxxxx>
- To: <ryan.satrom@xxxxxxxxxxx>, <si-list@xxxxxxxxxxxxx>
- Date: Fri, 14 Apr 2006 08:39:46 +0200
Hi Ryan,
I remember I have seen a presentation
made by Tektronics about lossy line characterization
It looks like that an important issue is
to take in to accouht the roughness
I would also include the dependance of the dielectric permittivity
over the frequency
You probably can find this presentation
by visiting the Ansoft web site and searching for roughness
hope this help
Giancarlo
-----Messaggio originale-----
Da: si-list-bounce@xxxxxxxxxxxxx per conto di ryansatrom
Inviato: gio 13/04/2006 23.50
A: si-list@xxxxxxxxxxxxx
Oggetto: [SI-LIST] Rogers4003 Board Characterization
To All-
I am currently doing some characterization work on a Rogers4003
board with microstrip and stripline traces. I use a 40GHz VNA, and
HFSS for 3D modeling of the launch structures, and AWR Microwave
Office for 2D constant cross-section structures and time-domain
measurements.
Most literature specifies the dielectric of Rogers4003 to be 3.38,
and loss tangent =3D 0.0027. From measurement, it looks like I am
getting a dielectric closer to about 3.7. (I used a TDR plot, Group
Delay plot, and measured the quarter-wave resonance to determine
wavelength - then used that to find dielectric).
Also, it seems to be very difficult to find good correlation between
simulation and measurement of traces longer than 1-2" above 5GHz.
It seems the measurements show MUCH more loss than simulation.
So my questions are:
1) Is 3.38 typically used for R4003 dielectric?
2) Has anybody verified this with lab data?
3) Can I expect correlation above 5GHz between
simulation/measurement, or is that as good as I can hope for?
Thanks,
Ryan Satrom
RF Engineer
Everett Charles Technologies
ryan.satrom@xxxxxxxxxxx
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