Vishram, Six layers is a tough stackup to use. If you make signals happy, you don't have much of a planecapacitor. If you make the plane capacitor happy, you don't have good SI. I use your first stackup and flood the unused space in the signa layers with copper. This I attach to the appropriate power rail and get enough plane capacitor to make many of these designs happy. Failing that, you need two more planes. Lee > [Original Message] > From: Vishram Pandit <vishrampandit@xxxxxxxxxxx> > To: <larry.smith@xxxxxxx> > Cc: <si-list@xxxxxxxxxxxxx> > Date: 9/10/2003 11:14:51 AM > Subject: [SI-LIST] 6 Layer Stack-up > > > > > > > We have been using the stackup S-G-S-S-P-S.(stack up no. 1). Now, with > suggestion from SI-List, on newer high speed designs, I would like to use G > adjacent to P with 4-6 mils of separation. It will give me very good > decoupling. However, I have only 6 layers so I have to have my stack-up as > S-S-G-P-S-S (stack up no. 2). Will it be okay? > > Here are pros and cons as per my analysis: > > 1] Stack up no. 1 gives you poor P/G decoupling, wheras stack up no. 2 gives > you very good P/G decoupling. > > 2] P/G Decoupling caps at higher frequencies (>500MHz) are not required for > stack up no. 2 > > 3]Stack up no. 1 will shield the EMI radiation from internal traces because > of G(Layer 2) and P(Layer 5).we will loose this benefit for the stack up no. > 2. > > 4] For stack up no. 1, signals on Layer 1, 3, 4, and 6 had a reference > plane.For stack up no. 2, only signals on Layer 2 and 5 have reference > planes. So I have to be careful routing high speed signals on Layer 1 and > Layer 6. > > Has anyone implemented stack up no. 2 on 6 layer board? Which stack up is > advisible for 6 layer board? What are pros and cons for stack up no. 1 and 2 > for a 6 layer board? > > > Thanks, > > Vishram > >From: Larry Smith >Reply-To: larry.smith@xxxxxxx >To: > vishrampandit@xxxxxxxxxxx >CC: si-list@xxxxxxxxxxxxx, > Charles.Grasso@xxxxxxxxxxxx >Subject: [SI-LIST] Re: Power Integrity (was: > UltraCAD ESR and Bypass Capacitor Caculator) >Date: Mon, 18 Aug 2003 > 09:11:42-0700 >>Vishram - I agree. My general approach is to address the PI > problem first >and make sure that the silicon circuits have clean power. > Thisinvolves >management of capacitance and inductance at the PCB, package > and chip levels. >Next, address the SI problems by making sure that all high > speed signals have >a good return current path. After doing these two > things,many EMI problems >will be eliminated. >>I have also been able to fix > EMI problems at multiple 100's of MHz by >using decoupling capacitors. But > the higher the frequency gets, the >harder it is to do this. Capacitors at > this frequency usually will not affect >the quality of the power as measured > at the silicon circuit terminals (PI), >but they might effect emmissions. > >>After we began using thin power plane >dielectrics, I don't believe we > havefound any EMI problems that can >be fixed with discrete decoupling > capacitors. But if your product does >not have thin power plane dielectrics > (4 mil or less) for cost or >other reasons, EMI problems can _sometimes_ be > fixed with caps. If >this works, it is usually not a very robust solution. > Ifsome little >thing changes, the EMI problem often crops back up again. > >>regards, >Larry Smith >Sun Microsystems >>Vishram Pandit wrote: > >>>>>>Larry, >>>>Very nice explanation. PI influences SSN, and SSN > influencesEMI. EMI is >>influenced by PI and SI. If we have sound PI and > also, reduce the SSN, then >>EMI (due to that aspect of the circuit) is > mitigated. Would you agree? >>>>As mentioned in my pevious mails, I have > seenimprovements in EMI at higher >>frequencies (as high as 800MHz) with > decoupling capacitors, and changing the >>P/G structure to improve the > impedance. Your email states that PI is >>characterized by P/G impedance and > decaps for PI are effective up to 100MHz. >>However, in my case, I reduced > the 800MHz impedance further by decaps >>betweenP/G, and by improving the > P/Gstrucutre, and it helped improve the >>EMI. Thus, improving PI at 800MHz > improved the EMI.Apart from chaning the >>structure of P/G, decaps (value, > ESL, locations) played important part in >>it. >>>>I will appreciate your > comments. >>>>Thanks, >>>>Vishram Pandit >>>>Senior Member Techincal Staff > >>>>Hughes Network Systems >>>>>From: Larry Smith >Reply-To: > Larry.Smith@xxxxxxx >To: >>si-list@xxxxxxxxxxxxx, > Charles.Grasso@xxxxxxxxxxxx>Subject: [SI-LIST] Power >>Integrity (was: > UltraCAD ESR and Bypass Capacitor Caculator) >Date: Fri, 15 >>Aug 2003 > 14:04:39 -0700 (PDT) >>I changed the thread name to better reflect >>the > subject.. >>Some of us at Sun have begun using a different word for the > >>power >distribution problem, "power integrity." This phrase helps to > >>>distinguish three major topics: power integrity (PI), signal integrity > >>>(SI)and EMI. Power integrity is the issue that Charles is addressing >and > >>signal integrity is what Kim is addressing in his very nice web >posting. > A>>lot of the confusion could be eliminated by using clearer >terminology. > >>I>>think of the "power integrity" problem as having only two nodes: Vdd > >and >>Gnd. There are no signals involved. For the power integrity >problem, > we are >>concerned with delivering many watts of power, often at >low > voltageand >>highcurrent, to modern digital technology. The big >issues are > transient >>current and DC loss. A good example is an >advanced micro > processor that >>draws as much as 100 watts of power at 1 >volt (100 amps). > The processor can >>go from an idle state to a fully >active state in just a > few clock cycles (1 >>nSec). The silicon circuits >may consume 50 amps and > then 100 amps just a >>fewcycles later. >Delivery of this 50 watt transient > through the various >>timeconstants, >which range from nSec to mSec (chip, > package, PCB, VRM, AC >>toDC >converter), is very much a part of the power > integrity problem. Note >>>that 1 mOhm of DC resistance in this circuit > consumes 10 watts of power >>>(I^2*R) and renders our delivery system only > 90% efficient. Power >>>Integrityinvolves delivering high current with huge > transients. It is >best >>understood and managed by the concept of target > impedance in the >frequency >>domain. >>Signal integrity, on the other hand, > always involves signal nodes. >>A >few years ago, at the 50 MHz level, > signalintegrity basically meant >the >>waveform quality and timing on ideal > transmission lines. Before >that, all >>wehad to worry about (at the 5 MHz > level) was RC time >constants. Now we are >>beyond 500MHz where we must be > concerned with >frequency dependent loss and >>return current paths. Several > years ago, >SSN (simultaneous switch noise) >>wasmostly an L*di/dt problem > that >created ground bounce in the DIP's (dual >>inline packages, lead > >frames). After we started including ground planes in >>our packages, > >replaced wire bonds with solder bumps and started using just >>as many > >ground pins as signal pins, the SSN problem changed to a power > >>plane>bounce and return current problem. This is how power integrity keeps > >>>getting mixed up with signal integrity. The return current for signals > >is>>on power and/or ground planes. But we can avoid a lot of confusion >if > we >>usethe term "power integrity" for topics that involve just Vdd >and > ground >>and reserve "signal integrity" for topics that involve >signal > nodes. >>>>Decoupling capacitors play a role in all three topics. For the > power >>>integrity problem, they are energy storage devices that mitigate > power >>>transients. They deliver energy when the voltage droops and store > >energy >>when the voltage spikes. For the signal integrity problem, they > >enable >>return current to jump from one node to another (i.e. Vdd1 to > >Vdd2or Vdd >>toGnd) when packages, vias or connectors require signal > >returncurrent to >>make the jump. For the EMI problem, they provide low > >impedance and energy >>absorption at frequencies where the product > >naturally has a lot of energy >>(clock) or frequencies where the product > >has a very efficient resonator or >>radiator. >>Decoupling capacitors are > effective for the power integrity >>problem in >the 100 kHz to 100 MHz > frequency band. Below 100 kHz it takes >>toomany >uF for them to be > effectiveand above 100 MHz their inductance gets >>in >the way. However, > decoupling capacitors may be used to complete return >>>current paths (SI) > orabsorb noise (EMC/EMI) up to much higher >>>frequencies.Below 50 MHz, > position on the PCB is not very important >but >>above 200 MHz, position > often becomes critical. Thin power plane >>>dielectricsare a good > replacementfor discrete decoupling >capacitors that >>are aimed at > frequencies above 100 MHz. Power plane >capacitance is "broad >>band" but > theQ of discrete capacitors becomes >sharp and limits their >>effectiveness > as frequency increases. >>Very few topics on SI-list seem to >>evoke as many > emotions as decoupling >capacitors. That is probably because >>people view > them from so many >different perspectives. Vastly different >>conclusions > canbe drawn for >decoupling capacitors depending on the problem >>you are > trying to solve >(PI, SI or EMI) and other variables such as power >>plane > dielectric >thickness. Some of this can be helped by clearly defining >>the > >terminology and use conditions. >>regards, >Larry Smith >Sun >>Microsystems > >>>Delivered-To: si-list@xxxxxxxxxxxxx >>From: "Grasso, >>Charles">>To: > "'si@xxxxxxxxxxxx'" , "'si-list@xxxxxxxxxxxxx'" >>>Subject: >>[SI-LIST] Re: > UltraCAD ESR and Bypass Capacitor Caculator >>Date: Thu, 14 >>Aug2003 > 15:39:34 -0600 >>MIME-Version: 1.0 >>Content-Transfer-Encoding: 8bit > >>>>X-archive-position: 7937 >>X-ecartis-version: Ecartis v1.0.0 > >>>>X-original-sender: Charles.Grasso@xxxxxxxxxxxx >>X-list: si-list >>>>Hi > >>Kim, >>First - thanks for putting the slides up on the bweb for >>all to > >>see.I think that you may have missed the point >>a little. In your > scenario>>(a signal trace switching >>planes )the location of the caps is > vital. >>>>>>The discussion was centered on the location of caps >>wrt power > >>distribution. The location of the capacitors >>(within reason) will not > >>affect a S11/S21 measurement >>that much. >>>>Fancy tackling that little > >>problem? >>>>Best Regards >>Charles Grasso >>Senior Compliance Engineer > >>>>Echostar Communications Corp. >>Tel: 303-706-5467 >>Fax: 303-799-6222 > >>>>Cell: 303-204-2974 >>Email: charles.grasso@xxxxxxxxxxxx; >>Email > >>Alternate:chasgrasso@xxxxxxxx > >>>>------------------------------------------------------------------ >To > >>unsubscribe from si-list: >si-list-request@xxxxxxxxxxxxx with > 'unsubscribe'>>in the Subject field >>or to administer your membership from > aweb page, go >>to: >//www.freelists.org/webpage/si-list >>For help: > >>>si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field >>List > >>archives are viewable at: >//www.freelists.org/archives/si-list >or > at>>our remote archives: >http://groups.yahoo.com/group/si-list/messages > >Old>>(prior to June 6, 2001) list archives are viewable at: > >>>http://www.qsl.net/wb6tpu > >>>>>>---------------------------------------------------------------------- > ------ >>Tired of spam? 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