[SI-LIST] Re: test board
- From: "Hill, John" <jhill@xxxxxxxxxx>
- To: <giuseppe.dabundo-univ@xxxxxx>, <si-list@xxxxxxxxxxxxx>
- Date: Thu, 25 May 2006 11:37:25 -0400
I am not sure where the 3D came from. I entered Z equal B, where I used
the "equal to" character???
John
=20
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-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]
On Behalf Of Hill, John
Sent: Thursday, May 25, 2006 11:26 AM
To: giuseppe.dabundo-univ@xxxxxx; si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: test board
Giuseppe,
Try Inter-Continental Microwave. Here is their URL:
http://www.icmicrowave.com/default.htm
For small SMD components they have complete kits with calibration
standards. See the following URL:
http://www.icmicrowave.com/C_&_L_Meas_Sol/Part_Numbers_Series_and_Shunt.
htm
I prefer testing through where Z =3D3D B. That is in a pi network the
through impedance is equal to the B value of the ABCD matrix.
Best regards,
John
=3D20
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The information in this email and attachments hereto may contain legally
=3D
privileged, proprietary or confidential information that is intended for
=3D
a particular recipient. If you are not the intended recipient(s), or the
=3D
employee or agent responsible for delivery of this message to the =3D
intended recipient(s), you are hereby notified that any disclosure, =3D
copying, distribution, retention or use of the contents of this e-mail =
=3D
information is prohibited and may be unlawful. When addressed to Takata
=3D
customers or vendors, any information contained in this e-mail is =3D
subject to the terms and conditions in the governing contract, if =3D
applicable. If you have received this communication in error, please =3D
immediately notify us by return e-mail, permanently delete any =3D
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-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]
On Behalf Of Giuseppe DABUNDO
Sent: Thursday, May 25, 2006 10:55 AM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] test board
Hi all,
I'm searching information to plane a test board to perform TDR or =
VNA=3D20
measurement for package characterization.
I need of a custom calibration kit with short,load and open =
standards=3D20
placed on the board at the point where
the DUT is mounted.This allows for the removal of the effects of the SMA
and transmission line on the PCB .
In this manner I don't need to de-embedding the test fixture.
A possible link for reference is :
*E. Godshalk, G. Sundberg "Characterization of Surface Mount Components
at Microwave Frequencies Using Wafer Probes,"
53rd Automatic Radio Frequency Techniques Group Conference Digest,=3D20
Anaheim, California, June 1999, pp. 131- 138
*How can I get this or anothers references ?
Thanks in advance!!!
Giuseppe
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