Hi Chris, This sounds like a combination of the SSN paper and the Functional DDR2 paper. I don't see any reason why it wouldn't work, though I wouldn't want to make any guarantees until I actually tested it. =20 The SSN example consisted of measuring the disturbance of one stable output while 100 other output pins were switching. The results correlated well against physical data. Its not exactly the data/strobe you were looking for, but I suspect it could be easily adapted. I'll leave my co-author to address the specifics. =20 Regards, Gary -----Original Message----- From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx] On Behalf Of Chris Cheng Sent: Monday, April 24, 2006 8:04 PM To: si-list Subject: [SI-LIST] Re: Session of interest to SI engineers at DesignCon 2006 Gary, Excellent, IBIS 4.1 with SSO !!!! Any chance you or the authors actually measure the data and strobe =3D signal distortion under SSO and compare with your simulation ? I would = =3D expect a DDR control should be the prime candidate to show what SSO can =3D do. -----Original Message----- From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]On Behalf Of Pratt, Gary Sent: Monday, April 24, 2006 1:37 PM To: si-list Subject: [SI-LIST] Re: Session of interest to SI engineers at DesignCon 2006 Greetings, The papers from the DesignCon sessions described below are available at the following links: http://si-list.org/files/mentor_designcon_2006/ =3D3D20 http://www.eda.org/pub/ibis/summits/feb06/wolff.pdf http://www.eda.org/pub/ibis/summits/mar06/vines.pdf =3D3D20 Please don't hesitate to contact me if you have any questions or would like additional information. Regards, Gary Pratt -----Original Message----- From: Pratt, Gary=3D3D20 Sent: Thursday, February 02, 2006 5:13 PM To: 'si-list' Subject: Session of interest to SI engineers at DesignCon 2006 Please be advised of an update to the SI sessions at DesignCon next week. In addition to the AMS tutorial you may have read about in the last notice, there will be an interesting paper on SSN simulation with large s-parameter models and IBIS 4.1; as well as a very interesting application of AMS in a fully functional SI simulation of a DDR memory interface. Please see the abstracts below, and if you are able to attend any of these, please give me the opportunity to greet you personally. =3D3D20 These 100% technical sessions will be of interest to high-speed device suppliers, users, and SI tool vendors. These are a great way to become familiar with the exciting capabilities of these new industry standards. DesignCon 2006 Monday, February 6, 9:00 am - noon Santa Clara Convention Center http://www.designcon.com/2006/ TF-MA2: Introduction to IBIS 4.1 AMS SERDES Driver Modeling, and Other Novel Applications of AMS Modeling=3D3D20 Modeling SERDES drivers has proven to be a significant challenge with traditional modeling techniques. Fortunately, the IBIS committee recognized this problem and ratified a new approach which offers significant advantages over existing techniques. This tutorial will enable the participant to understand and perhaps begin coding their own IBIS 4.1 models. This skill will be exercised by going through a number of actual examples of the standard and novel applications of its new capabilities (such as DFE). This presentation will show how IBIS 4.1/AMS is like having your own simulator programmer on staff. The applications are only limited by the imagination.=3D3D20 DesignCon 2006 Wednesday, February 8, 9:40 am - 10:20 am Santa Clara Convention Center http://www.designcon.com/2006/ 5-WA2: Fast Time-Domain Simulation of 200+ Port S-Parameter Package Models S-Parameters are quickly becoming the standard method in PCB SI analysis to describe packages, channels, and connectors. This paper will describe techniques for significantly improving the generation and transient simulation of typical s-parameter models and large (200+ port) s-parameter package models used for power distribution and simultaneous switching noise analysis. We show that direct representation of s-parameters by poles/residues is more efficient than creating equivalent circuits or performing direct convolution. This joint Altera/Mentor paper will also describe why it is important to simulate channels in transient analysis, the caveats of alternate frequency-domain channel analysis techniques, and how AMS models and these new transient s-parameter simulation techniques makes it feasible to perform transient simulation of hundreds of thousands of data cycles. DesignCon 2006 IBIS Summit Meeting Thursday, February 9 Hyatt Regency Hotel, Magnolia Room HDL and IBIS 4.1 Models in a Functional DDR Memory Interface Analysis 9:00 AM to 9:30 AM The Multi-Lingual AMS extensions of IBIS 4.1 provide significant new capabilities that can be used to implement many novel enhancements to SI verification techniques and applications. This joint Micron/Mentor paper will describe one such application that combines HDL functional models and IBIS I/O models to perform a thorough Signal Integrity verification of a complete Chipset to Memory interface. Electrical compliance and timing are verified on all address, data (both directions), and control lines in one simulation. The IBIS meeting is from 8:00 to 5:00 and will feature many other interesting presentations and discussions. I hope to have the opportunity to meet you at one of these events. Regards, Gary Pratt Gary L. Pratt, P.E. Product Manager - High-Speed Design Kits SDD Division Office: (503) 685-1177 Mobile: dial '0' at Voicemail, or mobile: (262) 337-2196 Email: gary_pratt@xxxxxxxxxx ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List FAQ wiki page is located at: http://si-list.org/wiki/wiki.pl?Si-List_FAQ List technical documents are available at: http://www.si-list.org List archives are viewable at: =3D20 //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu =3D20 ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List FAQ wiki page is located at: http://si-list.org/wiki/wiki.pl?Si-List_FAQ List technical documents are available at: http://www.si-list.org List archives are viewable at: =20 //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu =20 ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List FAQ wiki page is located at: http://si-list.org/wiki/wiki.pl?Si-List_FAQ List technical documents are available at: http://www.si-list.org List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu