Jose, If I understand correctly, you are saying that you measure a lower loss tangent than modeling and simulation predicts. There are several possibilities: 1. The measurement is correct, but your simulations over predict the specified loss of the material 2. The measurement is correct, and the material does not act as specified 3. The measurement is not correct. Let's assume that the measurement is correct and the simulations are correct, therefore the material is lower loss than the manufacturer specifies. Here's what I think is happening. RO4350B is a composite with glass reinforced hydrocarbon/ceramic. It is composed of: * An unnamed hydrocarbon (some sort of thermoset plastic) * Amorphous Fused Silica (<75%) * Continuous Filament Fiber Glass (<30%) * Titanium Dioxide (0 to 7%) The fiberglass used is standard 1080 E-glass. Here are the dissipation factors for each component of the laminate: * Amorphous Fused Silica tanD= .00033, Er=3.9 * 1080 E-glass = tanD= .0066, Er=6.6 * Titanium Dioxide tanD=.0017, Er=100 * unnamed hydrocarbon (who knows) The specifications for RO4350B are: * tanDelta = 0.0037 * Er = 3.48 +/- .05 In order to obtain a low Er and low tanDelta, the thermoset plastic must have both a lower Er than all the other materials combined and a fairly low tanDelta. My uneducated guess is that with different thicknesses of material, multiply plys of 1080 glass are used along with different percentages of Silica and the thermoset material. Then, to equalize the macroscopic Er, a pinch (0 to 7%) of Titanium Dioxide is thrown in for good measure. Each thickness of laminate has a different mixture of materials. If the materials were totally uniform then the tanDelta and Er would be uniform. However, because of the inclusion of 1080 E-glass, there will be localized variations of these parameters along the X and Y axis. From the materials data we know that the average Er is 3.48 +/- 0.05 and the worst case specified tanDelta is 0.0037. Now at 10 GHz, Rogers uses the IPC-TM-650-2.5.5.5 stripline resonator method for measuring Er and tanDelta. In this method a sample of material with an etched copper resonator is sandwiched between two copper plates 1 inch wide. A trace is etched the appropriate resonant length on a sample of material, and then it is sandwiched with 2 other samples of dielectric between the plates. For this method to be accurate and repeatable, a fairly wide trace is used, so the the macroscopic behavior of the material is measured. (i.e. The trace is really wide so that there is a good average of the composite material properties.) Once done, Er is specified, along with a worst case maximum tanDelta. Now, this method is sensitive to the size of the sample being used. The larger the sample, the better the average. Rolled vs electroplated copper will also give different results due to surface roughness. However, there are two clues in Rogers literature. "It has been reported in some microstrip applications , a delta of 0.2 in dielectric constant has been observed for both RO4003 and RO4350B based on actual circuit measurements and circuit modeling comparisons." "Dielectric constant typical value does not apply to 0.004 laminations. Dielectric constant specification value for 0.004 RO4350B material is 3.36 +/-.005. Clearly, the fiberglass weave is having an effect on the Er of the material. If this is the case, then it will also have an effect on the dielectric loss of the material. Interestingly enough, 1080 glass has a weave pattern of 60 x 47 threads in the warp and weave directions. This corresponds to fiber pitch of 16.7 mils in one direction and 21.3 mils in the other. Unless you know how your board was placed on the panel and how the panel was oriented with respect to the original fiber weave roll direction, it's hard to say which your trace will lay on if it the trace is oriented in either the x or the y directions. Jose, in the case of your trace width of 21 mils, it is well matched to weave pitch of 21.3 mils. This means that if you happen to route in that direction you will see a good average Er and loss tangent, similar to the specification measurements made. If you route in the other direction, there is a mismatch between your trace width and the 16.7 mil fiberglass pitch. In this case, your Er will be dependent upon how your trace lays w.r.t. the glass. You may see a higher percentage of fiber or you may see a higher percentage of silica and plastic. A higher percentage of fiber will raise the average Er and raise the average tanDelta. And, if your routed your trace diagonally you will see yet a different result. Given the non-homogeneous nature of RO4350B, you cannot count on a fixed Er or a fixed tanDelta. These will change with the size of the trace and it's position on the laminate w.r.t. the underlying fiberglass. The numbers that Rogers reports for their material are truly only valid for their particular test method. We would need for them to report the actual size of the sample that they used and it's orientation with respect to the fiberglass reinforcement for a more full understanding of it's true performance limits. best regards, Scott Scott McMorrow Teraspeed Consulting Group LLC 121 North River Drive Narragansett, RI 02882 (401) 284-1827 Business (401) 284-1840 Fax http://www.teraspeed.com Teraspeed® is the registered service mark of Teraspeed Consulting Group LLC jose_moreira@xxxxxxxxxxx wrote: >Hi > >I would like to raise a question regarding to the dissipation factor = >(tan d) of Rogers4350. > >My question is related to the problem posted by Ming Tsai some time ago = >on the difference between measured and simulated loss of a microstrip in = >Rogers. > >In my case I have microstrip with 21mil width and 10.2 inch length. When = >I simulate the trace with the Rogers4350 specd value (~0.0037 at 10Ghz) = >I get a insertion loss that is much higher that the measured values. On = >my simulation I include a surface roughness factor of 1 micro-meter = >which I would say is Ok. I also add the maximum guaranteed insertion = >loss of the connectors. The connectors on my board are 2.4mm and I use = >and optimized footprint obtained thorough 3D simulation by the connector = >manufacturer.=20 > >When looking for an answer to this problem I came across a presentation = >from Chad Morgan from AMP where there is a slide with the measured = >dissipation factor for several dielectrics and I see that for Rogers = >they were measuring around 0.008!!. > >When I use this new value on my simulations I start to get some = >reasonable correlation between simulation and reality. > >Has anyone looked into the real dissipation values for Rogers4350 and = >other dielectrics (e.g. Rogers4003C) that you get on real boards?? > >Best Regards >Jose Moreira > >_____________________________________________________ > >Jose Moreira >Application Consultant >STS Center of Expertise > >Agilent Technologies R&D and Marketing GmbH & Co.KG >Herrenberger Strasse 130 >CCST-BUS >D-71034 Boeblingen >Germany > >Email: jose_moreira@xxxxxxxxxxx >______________________________________________________ >=20 >=20 >------------------------------------------------------------------ >To unsubscribe from si-list: >si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field > >or to administer your membership from a web page, go to: >//www.freelists.org/webpage/si-list > >For help: >si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field > >List FAQ wiki page is located at: > http://si-list.org/wiki/wiki.pl?Si-List_FAQ > >List technical documents are available at: > http://www.si-list.org > >List archives are viewable at: > //www.freelists.org/archives/si-list >or at our remote archives: > http://groups.yahoo.com/group/si-list/messages >Old (prior to June 6, 2001) list archives are viewable at: > http://www.qsl.net/wb6tpu > > > > > ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List FAQ wiki page is located at: http://si-list.org/wiki/wiki.pl?Si-List_FAQ List technical documents are available at: http://www.si-list.org List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu