Hi All, A common accessory for FET probes can, in some cases, cause a significant error in the measurement and cause a great deal of time lost when debugging a circuit. My September Technical Tidbit at: http://www.dsmith.org describes the problem. The accessory in question is a probe tip with a small ground "spring" or "pin" on a hinge and uses a small ferrite core to improve probe response. Its use can make the FET probe ten times more sensitive to logic noise on the board and other EMI that you are not trying to measure. Such a sensitivity can cause one to "see" a glitch that is not there on a logic signal, a real time burner in the development lab or troubleshooting environment. The article presents scope data to show the magnitude of the problem which affects several brands of FET probes. The Technical Tidbit area is at the bottom of the index page. ---------- In addition, I have posted pictures to the website from Montreal and the IEEE EMC Symposium that was held there a few weeks ago. The link to the pictures is just above the Technical Tidbit area at the bottom of the index page. Doug -- ------------------------------------------------------- ___ _ Doug Smith \ / ) P.O. Box 1457 ========= Los Gatos, CA 95031-1457 _ / \ / \ _ TEL/FAX: 408-356-4186/358-3799 / /\ \ ] / /\ \ Mobile: 408-858-4528 | q-----( ) | o | Email: doug@xxxxxxxxxx \ _ / ] \ _ / Website: http://www.dsmith.org ------------------------------------------------------- ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu