[SI-LIST] DesignCon sessions on dielectric and conductor roughness modeling

From: "Yuriy Shlepnev" <shlepnev@xxxxxxxxxxxxx>
To: <si-list@xxxxxxxxxxxxx>
Date: Wed, 22 Jan 2014 11:20:33 -0800

I hope to see all SI list members next week at DesignCon 2014 :-))) 
There will be a lot of interesting papers covering SI and PI topics:
http://www.designcon.com/santaclara/schedule-builder/calendar. 
I am going to attend as many as I can and will talk about broadband
dielectric and conductor roughness modeling at the following sessions:

- Lessons learned: How to Make Predictable PCB Interconnects for Data Rates
of 50 Gbps and Beyond; presentation by W. Beyene, Y.-C. Hahm, J. Ren, D.
Secker, D. Mullen, Y. Shlepnev on Wed., January 29, 9:20am - 10:00am. 
See more at
http://www.designcon.com/santaclara/schedule-builder/session-id/826741

- Dielectric and conductor roughness model identification for successful PCB
and packaging interconnect design up to 50 GHz, presentation by Y. Shlepnev
on Thur., January 30, 11:05am - 12:00pm, Mission City Conference Room 1
(M1). 
See more at
http://www.designcon.com/santaclara/schedule-builder/session-id/827960  
This session can be attended with Expo Pass - free Expo Passes are still
available at www.designcom.com  and will be also available at the Santa
Clara Convention Center. 

- Closing the loop: What do we do when measurements and simulations don't
match? - panel discussion hosted by Martin Rowe with panelists: D. Burnes,
J. Miller, S. McMorrow, A. Neves, S. Pytel, Y. Shlepnev, Thur., January 30,
3:45pm - 5:00pm. 
See more at
http://www.designcon.com/santaclara/schedule-builder/session-id/826980 

I hope to see your there.
Best regards,
Yuriy

Yuriy Shlepnev, Ph.D.
President, Simberian Inc.
3030 S Torrey Pines Dr. Las Vegas, NV 89146, USA
Office +1-702-876-2882; Fax +1-702-482-7903
Cell +1-206-409-2368; Virtual +1-408-627-7706
Skype: shlepnev

www.simberian.com 
Simbeor - Accurate, Fast, Easy and Affordable Electromagnetic Signal
Integrity Software
2010 and 2011 DesignVision Award Winner

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[SI-LIST] DesignCon sessions on dielectric and conductor roughness modeling

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