[SI-LIST] Agenda, European IBIS Summit at DATe 2004 , February the 20th 2004
- From: Ralf Bruening <ralf.bruening@xxxxxxxx>
- To: ibis-users@xxxxxxx, ibis-quality@xxxxxxxxxxxxx,si-list@xxxxxxxxxxxxx
- Date: Fri, 13 Feb 2004 16:17:11 +0100
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IBIS SUMMIT
AGENDA
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D A T e 2004 - I B I S S U M M I T M E E T I N G
Time/Date: Friday, February 20, 2004, 9:00 AM to 2:15 PM
Location: DATe 2004 Conference
Room: Dupin 1
CNIT, La Defense - International Congress Center
Paris, France
Content: Presentations and Discussions
Purpose: Solicit and Exchange IBIS Model Related Information and
Ideas.
Sponsors: Zuken, Cadence, Mentor
DATe 2004: CNIT, La Defense - International Congress Center
Paris, France
February 16 - 20, 2004
See http://www.date-conference.com for more information.
All times Middle European Time (MEZ)
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To All:
You are invited to attend the European IBIS Summit Meeting in
Paris, France, especially if you are already going to DATE 2004:
The meeting is free to people interested in IBIS modeling, digital
circuit design and related EDA tool development. Refreshments and
a quick lunch are included.
If you plan to attend, please notify me via eMail at the
address at the end - even as well short notive attendence
is possible at the meeting.
Those wishing to attend short notice must register for
free admission to the DATe conference+exhibition.
The Agenda is below.
Ralf Bruening
Zuken
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AGENDA EUROPEAN IBIS SUMMIT MEETING
Friday, February 20, 2004, 9:00 am
Room: Dupin 1
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8:30 REFRESHMENTS & SIGN IN
9:00 WELCOME AND INTRODUCTIONS
- Ralf Bruening, Zuken, Germany
9:10 IBIS QUALITY
- Bob Haller, Signal Integrity Software (SiSoft), USA
(Presented by Eckhard Lenski, Siemens AG, Germany
9:35 VERIFICATION OF IBIS MODELS
- Hans Klos, Sintecs BV, The Netherlands
10:00 IBIS MODEL DEVELOPMENT AND VALIDATION
- Shripad Annigeri, WiPro, India
10:25 SENSITIVITY ANALYSIS OF IBIS-PARAMETERS WITH HSPICE
- Manfred Maurer, Siemens AG, Germany
10:50 BREAK (15 Minutes)
11:05 IBIS MODELS, CURRENT STATUS AND SOME NOTES ON IBIS4.0 Parameters
- Eckhard Lenski, Siemens AG, Germany
11:30 IBIS AND EMI SCREENING TOOLS
- Ralf Bruening, Zuken, Germany
11:50 A FREEWARE ENVIRONMENT FOR IC EMISSION SIMULATIONS
BASED ON ICEM AND IBIS
- Etienne Sicard, INSA, France
12:15 LUNCH/DISCUSSION (45 Minutes)
13:00 THE BENEFITS OF MULTI-LINGUAL EXTENSIONS TO IBIS
- Stephanne Rousseau, Mentor Graphics, France
13:25 PARAMETRIC MODELS IN IBIS MULTILINGUAL FRAMEWORK
- F.G. Canavero, I.A. Maio, B. Ross*, I.S. Stievano
Politecnoico di Torino, Italy,
*Teraspeed Consulting Group, USA
(Presented by I.S. Steivano, Politecnico di Torino)
13:50 LUMPED SKIN EFFECT MODEL FOR PACKAGE LEADS
- A. Ege Engin, Franhofer IZM/University of Paderborn,
Germany
14:15 BREAK AND END OF MEETING
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Sponsors: Zuken, Mentor Graphics and Cadence Design Systems
DATE2004: February 16 - 20, 2004. The IBIS meeting is scheduled the day
following the exhibition portion of the Conference.
See http://www.date-conference.com for more information.
SIGNUP
People involved in IBIS Model development, EDA tool development, and digital
circuit design are invited to participate in the European IBIS Summit meeting.
If you plan to attend, please supply the information below:
Name:
E-mail address:
Company:
Telephone:
Send to:
Ralf Bruening (ralf.bruening@xxxxxxxx)
_____________________________________________
Ralf Bruening
Product Manager High Speed Design/Partner & Solution Business
Zuken EMC Technology Center
Vattmannstr.3
33100 Paderborn
Germany
Tel: ++49 (0) 5251 150 600 (direct -621)
Fax: ++49 (0) 5251 150 700
Cellular: +49 170 4228512 (alternative: +49 172 9070675)
Email: ralf.bruening@xxxxxxxx
Web: www.zuken.com
_____________________________________________
This message is for the designated recipient only and may contain
privileged, proprietary, or otherwise private information. If you have
received it in error, please notify the sender immediately and delete
the original. Any other use of the email by you is prohibited.
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