[SI-LIST] 11/18 Free EMC Technical Webinar: Near-Fied EMI Detection

From: "Eriko Yamato" <eriko@xxxxxxxxxxxxxx>
To: <si-list@xxxxxxxxxxxxx>
Date: Tue, 8 Nov 2011 12:46:16 -0800

TechDream would like to invite you to a Free EMC Technical Webinar - Test
Applications Using an Automated Near Field Detection System.
 
Date: November 18th, 2011
Time: 10:00 - 11:30 AM (PST)
 
Abstract::
EM-ISight is a near-field EMC scanning system that can be used as an
alternative for costly pre-compliance chambers and for de-bugging assemblies
for noise sources. This webinar will cover some of the test applications
which EM-ISight has been used and shown success in solving noise / emissions
on complex electronic assemblies. Introduction to IEC-61967 and the
application of EM-ISight and using EM-ISight to conduct de-sense testing for
cellular and AGPS modes of operation shall be presented.
 
Click
<http://tech-dream.com/wp/november-18-2011emc-technical-webinar-from-aprel/>
here to register.
 
Best regards,
Eriko Yamato
 
VP of Sales and Marketing
TechDream, Inc.
20085 Stevens Creek Blvd. #110
Cupertino, CA 95014
Phone: 408-483-5413
E-mail:  <mailto:eriko@xxxxxxxxxxxxxx> eriko@xxxxxxxxxxxxxx
 

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[SI-LIST] 11/18 Free EMC Technical Webinar: Near-Fied EMI Detection

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