Just curious whether argyll has any capabilities with regards to profiling
'backlit media'?
I was looking at X-Rite iO Table / i1profilerPro3 "solution" and the process
is quite involved. First, measure a "light table", thin enough to place on
the surface of the iO table, to sort of "flat-field" it (I guess), and then
measure some target in patch mode.
Any thoughts? Suggestions? Experiences?
/ Roger
