Gerhard Fuernkranz wrote:
I'm actually puzzled why in
the use of TPS for device characterization is considered so novel? Argyll is obviously already using (a discrete, piecewise linear variant) of multi-dimensional TPS for device characterization over the past years.
Ah well, everything old is new again !
My implementation was based on Don Bones reports, some of which were published by the SPIE in 1993, and the SPIE has some association with IS&T, jointly publishing a journal together. I guess the paper does hold something new, or the peer review wasn't diligent enough in noticing the lack of some references.