[SI-LIST] WG: S-parameter Bisection
- From: "Havermann, Gert" <Gert.Havermann@xxxxxxxxxxx>
- To: "Moeller, Merrick" <mmoeller@xxxxxxxxxxxxxxx>, si-list@xxxxxxxxxxxxx
- Date: Wed, 11 Nov 2009 09:56:51 +0100
Hi Merrik,
there were two papers at DesignCon (07 and 09) about this topic. The first
described the process mathematically, the latter was an case study by Huawei
and Agilent who implemented this feature into their PLTS Software, and how
accurate it is (very accurate when everything is symmetrical).
DC07: 13-WP2: A Novel Procedure for Characterization of Multiport High-Speed
Balanced Devices
DC09: 12-TH2: A Comparison of Fixture Removal Methods for Characterization of
Differential PCB Channels
I attached papers and presentations for you, others have to find the papers on
teh designCon page or ask me privately.
BR
Gert
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-----Ursprüngliche Nachricht-----
Von: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx] Im
Auftrag von Moeller, Merrick
Gesendet: Dienstag, 10. November 2009 19:04
An: si-list@xxxxxxxxxxxxx
Betreff: [SI-LIST] S-parameter Bisection
Is it possible to split a passive S-parameter matrix into two equal sections?
For example; given s-parameters for a transmission line of a 10" length can the
matrix be split into two 5" lengths. Assume that the passive s-parameter obeys
reciprocity.
The reason I'm asking is that I have a test fixture on each end of my
measurement that I'm trying to de-embed. The insertion loss can be subtracted
very easily, but the return loss and other parameters have a great deal of
error dealing with de-embedding from one side of the DUT only. I'm hoping to
break the fixture into two equal parts without having a direct point of
measurement to do so otherwise.
Merrick M. Moeller
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