Hello, I have not checked the procedure in detail, because I don't think it makes really sense do do the measurement in the System (I communicated this already to Agilent ... ) Table 30 of 79-3E spec: Voh(DC) is given for the IV curve linearity measurement Voh(AC) is given for AC slew rate measurements when driving into an effective test load of 25Ohm against VTT Of course you can measure this values in a Read burst in the system (when probing at the controller side), but this are device output parameter and nothing one want to measure in the System. What you would need to do is to get the input parameters of your controller and measure Vih/Vil of your controller spec for Reads at the controller side ... One would need to generate 3 sets of measurement in the compliance test: - System Write parameters for measurement at the DRAM - System Read parameters for measurements at the Controller - Device output parameters test for measurement of device parameters on a special test load board. My target was to prepare this three setups with the next compliance test I'm doing. If anybody is interested in this three setups just contact me directly ... Hermann Our next Events: ================ Visit us on Embedded World 2013 in Nuremberg 26-28.02.2013 Hall 1, Booth 430 Check our website or contact us for details EKH - EyeKnowHow Hermann Ruckerbauer www.EyeKnowHow.de Hermann.Ruckerbauer@xxxxxxxxxxxxx Veilchenstrasse 1 94554 Moos Tel.: +49 (0)9938 / 902 083 Mobile: +49 (0)176 / 787 787 77 Fax: +49 (0)3212 / 121 9008 schrieb Mik Nazaryan: > Hi All, > Currently I have a project with DDR3 running at 800 MHz, and my automatic > test equipment&software sometimes surprises me with bugs :). So I decided to > do some measurements manually. > I read the "measurement algorithm" for VOH (AC) and VOH (DC) from Agilent > DDR3 Compliance Test instructions. > Measurement algorithm VOH (AC) and VOH (DC) are the same ! ? Can't find any > difference !!! > Thus, the question arises. If the measurements algorithms are the same > , sowhy the > specification is different? > Here is Measurement Algorithm for DC and AC as well. > Measurement Algorithm > 1 Acquire and split read and write burst of the acquired signal. > 2 Take the first valid READ burst found. > 3 Find all valid positive pulses. A valid positive pulse starts at VREF > crossing at valid rising edge and ends at VREF crossing at the following > valid falling edge. > 4 Zoom in on the first valid positive pulse and perform VTOP measurement. > Take the VTOP measurement result as VOH(AC) value. > 5 Continue the previous step with the rest of the valid positive pulses > that were found in the burst. > 6 Determine the worst result from the set of VOH(AC) measured. > > Thanks. > > > ------------------------------------------------------------------ > To unsubscribe from si-list: > si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field > > or to administer your membership from a web page, go to: > //www.freelists.org/webpage/si-list > > For help: > si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field > > > List forum is accessible at: > http://tech.groups.yahoo.com/group/si-list > > List archives are viewable at: > //www.freelists.org/archives/si-list > > Old (prior to June 6, 2001) list archives are viewable at: > http://www.qsl.net/wb6tpu > > ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List forum is accessible at: http://tech.groups.yahoo.com/group/si-list List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu