Hi Anto, I think the usual answer is in order here, too: it depends. A few important things that matter in case you want to measure a component after a cable and you do not want or can not do calibration at the end of the cable: a) frequency range of interest, b) ratio of impedances of your original DUT and impedance of DUT transformed through the cable. In other words: what is the DUT you want to measure, up to how high frequencies, and how long and what quality of cable do you want/need to use? The more we want to deembed or back-calculate, the more cumulative error we may have due to practical limitations. Regards, Istvan Novak Oracle On 7/25/2014 1:37 AM, Anto Davis wrote: > Thanks for the replies, > > I am going through the book, Signal Integrity Characterization > Techniques by Mike Resso and Eric Bogatin Ch.9, > It is explaining the method of de-embedding for two port n/w. > > I am doing a one port measurement; the impedance of a single loop > (inductance), using VNA. > VNA is calibrated at the plane of VNA port, and using 50 ohm coaxial > cable (which is not included in the calibration process), connected to > the DUT (single loop). > > 1) Instead of using De-embedding, can I directly use the method > explained in Section 9 of the paper "Inductance Calculations in a > Complex Integrated Circuit Environment" by A. E. Ruehli? > Or when we talk about one port measurement, does de-embedding and the > method explained in that paper become same? > > 2) With De-embedding can I avoid buying the calibration kit, if the > VNA is already calibrated at the connnection ports? (Say, I am ok with > slight variations due to time) > Basically, can I de-embed the coaxial cable connectors also with the > fixtures? > > Anto > > > > On Thu, Mar 13, 2014 at 6:13 PM, Istvan Novak > <istvan.novak@xxxxxxxxxxx <mailto:istvan.novak@xxxxxxxxxxx>> wrote: > > Hi Anto, > > 1) If you have a large-size DUT with low capacitance, it means > that in addition to > the impedance of the DUT we may also have a lot of stray > capacitance from the > large DUT body to ground, which distorts the results if we wanted > to measure > the DUT in the series connection scheme. Typical such scenario: > measuring the > power/ground plane capacitance of an unpopulated board at low > frequencies. > > 2) Each instrument has finite resolution, repeatability, noise > floor and accuracy. > If we connect the DUT in shunt-through connection, the conversion > formula > giving you impedance from S21 becomes very sensitive to small data > errors > when the DUT impedance is large. There are low-frequency VNAs, > such as the > Agilent E5061B, which can work down to a few hertz quite > accurately. And cable > length actually matters much less as frequency goes down. > > Regards, > > Istvan Novak > Oracle > > > On 3/13/2014 1:51 AM, Anto Davis wrote: > > Dr. Istvan, > 1) From your book, why series through connection for higher > impedances? Why > do you suggest size of DUT to choose between series through > and shunt > through? Shouldn't it be based on the impedance only? > > 2) VNA measurement for lower frequencies is a challenge; they > extrapolate > for lower frequencies? > They rely on reflection coefficients for measuring impedance. > So if I > connect longer cable, will it give better results for lower > frequencies? > For eg, if have 1m (=0.5m+0.5m) total cable length and the DUT > is very > small, v = 2e8 m/s taking wavelength/4 for distinguishing > between lumped > equivalent and Transmission line, below 50MHz, will it be > treated as a > lumped equivalent? And in this case anything less than 50MHz > will be > extrapolated by VNA? > Basically, is there a minimum length for connection cable for > a minimum > frequency? > > Thanks, > Anto > > > On Wed, Mar 12, 2014 at 6:23 PM, Istvan Novak > <istvan.novak@xxxxxxxxxxx <mailto:istvan.novak@xxxxxxxxxxx>>wrote: > > Hi Anto, > > Fair question, but for most practical situations, you dont > need to worry. > Even with very simple instrumentation, like a VNA created > around a little > USB-powered oscilloscope with an arbitrary waveform > analyzer), the > Two-port shunt-through measurement will be reasonably good > up to > at least a kohm impedance magnitude. Professional network > analyzers > have better resolution and you get reasonable result at > least up to ten > kohms. For a 0.1uF capacitor this means you dont need to > worry about > this potential problem unless you want to measure the > impedance at > frequencies with single digits or below. If that was the > case, you can > use either traditional impedance bridges or just use the > same two-port > setup but switch to series-through connection. > > Best regards, > Istvan Novak > Oracle > > > > On 3/12/2014 7:12 AM, Anto Davis wrote: > > Hi, > I am trying to get the impedance plot of a 0.1uF > capacitor (using VNA), > which has ESL and ESR associated with it. The > frequeuncy response should > be > a V curve. From the book, Frequency Domain > Characterization of PDN by > Istvan Novak (ch-5) I realized that two port > measurements are better > (measuring Z12 or S12) when Z << 50 ohms. > But for a single capacitor, how to get the V curve? If > I connect it to > measure as Z12, I can measure it correctly for > frequencies where Z<<50 > ohms > only? > > Thanks, > Anto > > > > > > > ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List forum is accessible at: http://tech.groups.yahoo.com/group/si-list List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu