[SI-LIST] The Elusive Glitch - Part 3
- From: "Douglas C. Smith" <doug@xxxxxxxxxx>
- To: si-list <si-list@xxxxxxxxxxxxx>
- Date: Thu, 06 Dec 2001 19:45:47 -0800
The Elusive Glitch - Part 3
This month on http://www.dsmith.org, the Technical Tidbit is the final
Part 3 of the Elusive Glitch story. The first two articles in October
and November talked about how ESD and other impulsive events can disrupt
measurements on digital circuits. Also covered were techniques for
determining when such disruption is occurring.
Part 3 of the Elusive Glitch for December shows how fields from
impulsive events can be accurately measured. This is not a technique
most of us will use in the lab, but standards committees are using such
methods to write new standards that will show up in our design
requirements in the future.
--
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___ _ Doug Smith
\ / ) P.O. Box 1457
========= Los Gatos, CA 95031-1457
_ / \ / \ _ TEL/FAX: 408-356-4186/358-3799
/ /\ \ ] / /\ \ Mobile: 408-858-4528
| q-----( ) | o | Email: doug@xxxxxxxxxx
\ _ / ] \ _ / Website: http://www.dsmith.org
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