Hi Naveen,
this is confuding. As far as I know, you can use S4P files for de-embedding in
sparq 4-Port. There is a limit that lets you only load a maximum of s8p, but
since you do not have a S8P file, who cares? The S8P limit is for cases where
the complete "probe" (input and output Port) is in a single S-parameter file,
but you have s4p for each probe, so it shouldn'd be a problem to load these
into the sparq software and do the de-embedding.
The only concern you have to care about is, if the coupling of the differential
probe in combination with your probe land pattern and the S-Parameters you
received with the probes perform equally.
BR
Gert
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-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx <si-list-bounce@xxxxxxxxxxxxx> On Behalf Of
Naveenchandra V
Sent: Thursday, August 23, 2018 7:34 AM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Regarding VNA Fixture de-embedding by using S-parameter
models
Hello Experts,
I am trying to measure the impedance, insertion loss and return loss for one
diff pair of PCB trace (one of our high speed board) by using SPARQ 4000E 4
port VNA. But I am struggling with Fixture/probes de-embedding by using
S-parameter models. I have been received S-parameter models (i.e. two 4- port
models, 25GHz Port 1 to 3 with match terms, similarly 25GHz Port 2 to 4 with
match terms) for de-embedding from the DVT probes vendors. However, our major
concern is that, how to use these S-parameter model in the SPARQ VNA? Since
SPARQ is asking 8 port S-parameter model?. Below are few technical feedback
from SPARQ.
You need to have equal number of physical ports on the SPARQ as you DUT. Since
you have a SPARQ 4004E, which is 4 Ports will be limited to s8p for fixture
de-embedding. This s8p file needs to be provided by the you. With 4 ports you
will be able to test one diff pair of trace and not two diff pairs which will
need 8 ports.
If we would like to test one diff pair of trace , probably we need 4 ports
S-parameter model only but not s8p model. We have 4 ports on the SPARQ and two
differential probes which should be combined to create two differential
input/output ports. Correct me if I am wrong. Could you please help us on this
concern. It would be very helpful.
Thanks,
Naveen
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