[SI-LIST] Measuring 0.13micron CMOS devices
- From: "srinivasan" <d.srinivasan@xxxxxxxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Fri, 14 Mar 2003 20:40:07 +0530
Hi,
We have in out design some 0.13micron devices. We use Fluke 73-III DMM and
EZ DM333 DMM for impedance and voltage measurement on the power section of
the PCB. Some of the devices had gone bad. There is some argument that the
multimeter voltage whose output is 0.74V may be the cause of the problem.
Can I know if there is any specific way a CMOS circuit of high pkg density
be measured. Also can any one suggest if this is the real reason behind the
failures we are encountering. We had taken precautions for ESD related
issues. Is there any thing more we are missing on.
The VDD section of the chip which was measuring around 10 to 15Kohms has
drastically reduced to 3 to 6 ohms. One possibility what we are looking at
is the component degradation (Especially decaps).
Thanks and Regards,
D.Srinivasan,
GDA Technologies Ltd,
18, Bawa Road, Alwarpet
Chennai - 600 018
Ph: 91-44-2499 3832
91-44-2466 1653
Fax: 91-44-2467 1109
Visit us at www.gdatech.com
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