Hi all, This particular question is going to both the SI and IBIS reflectors, as the issues touch both groups. Question 1 (for the SI-listers) How often are people seeing IBIS models that use the [Model Spec] keyword to list min/typ/max values for parameters like Vinl, Vinh and Vmeas? Are you seeing this commonly, or was your response "what is he talking about"? Question/Comment 2 (for the IBISians) Is there any definitive, short, concise document that lists which combinations of which IBIS parameters are meant to represent best, typical, and worst-case component-level performance? As an example, the [max] section of a V/I curve would clearly indicate best-case device performance, but you'd have to combine that with the [min] value of a parameter like c_comp. So - for best case conditions, the EDA tool and the model creator both have to use the same set of conventions of combining parameters for best, typical and worst case device performance. Is there a table anywhere that defines this? Todd. Todd Westerhoff SI Engineer Hammerhead Networks 5 Federal Street Billerica, MA 01821 twester@xxxxxxxxxxx ph: 978-671-5084 ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu