[SI-LIST] Re: Bit Error Caused by NOISE
- From: jrbarnes@xxxxxxxxxxx
- To: xlh9504@xxxxxxxxx, si-list@xxxxxxxxxxxxx
- Date: Mon, 26 Nov 2001 09:09:07 -0500
Lianghu,
The best book I have read across on measuring signals in the presence of noise
is:
High Frequency Measurements and Noise, by Douglas C. Smith.
It is available directly from Doug through his very informative High Frequency
Measurements Web Page at:
http://emcesd.com/
Doug talks a lot about doing "null experiments" to find the best test setup, and
how to measure the basic noise level of your test setup.
I have over 2000 electronics books (24 bookcases full, going on 25) in my
personal collection. My book, "Electronic System Design: Interference and Noise
Control Techniques", was published by Prentice-Hall in 1987, then translated
into Russian and published by Mir in 1990. But I learned more about lab
techniques from Doug's book, than I had learned from all my reading and working
in the computer/electronics industry for 28 years!
John Barnes Advisory Engineer
Lexmark International
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