[SI-LIST] Re: An opportunity to participate in a 2x thru fixture de-embed

  • From: "Jim Nadolny" <jim.nadolny@xxxxxxxxxx>
  • To: "Daniel, Erik" <Daniel.Erik@xxxxxxxx>, <si-list@xxxxxxxxxxxxx>
  • Date: Tue, 16 Nov 2010 13:27:55 -0500

Just piling on....

We did more or less the same thing with Vahe Adamian and Brad Cole at
DesignCon '09.  But I think Agilent is being a bit more rigorous :)

Jim Nadolny
Samtec

-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]
On Behalf Of Daniel, Erik
Sent: Tuesday, November 16, 2010 7:09 AM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: An opportunity to participate in a 2x thru
fixture de-embed

Eric-

As you might already be aware, a number of years ago, we developed a
de-embedding method that sounds very similar to what you described.  It
was presented at ARFTG in 2003 -- you can pull the paper ("Network
Analyzer Measurement De-embedding Utilizing a Distributed Transmission
Matrix Bisection of a Single THRU Structure") from IEEE XPLORE.  We have
used this method for both 2 port and 4 port de-embedding (though the
paper only discusses 2 port).  It has its limitations, but we've used it
successfully in a wide range of scenarios (on wafer, PCBs, etc.)

It will be interesting to see how your method compares.

- Erik


Erik Daniel, Ph.D.
SPPDG Deputy Director
Consultant, Department of Physiology and Biomedical Engineering
Secretary: 507-284-4056
Fax: 507-284-9171
E-mail: Daniel.Erik@xxxxxxxx
Web:  www.mayo.edu/sppdg
_______________________________
Mayo Clinic
200 First Street SW
Rochester, MN 55905
www.mayoclinic.org



 
> Msg: #1 in digest
> From: "Eric Bogatin" <eric@xxxxxxxxxxxxxxx>
> Subject: [SI-LIST] An opportunity to participate in a 2x thru fixture
de-embed
> Date: Mon, 15 Nov 2010 08:34:33 -0600
> 
> Hi folks-
> 
> 
> I have a great opportunity for a few lucky companies.
> 
> 
> 
> I am working on a DesignCon forum with Agilent about a new calibration
> technique for measured S-parameter behavioral models of interconnects-
> both single ended and differential, and I am looking for examples to
show
> off.
> If you have an interconnect element you have already built and would
like it
> included in my presentation, please contact me off line. If you have
the right
> sort of sample, I will arrange for the measurements.
> 
> 
> 
> This technique applies if you have a symmetric, 2x thru reference
structure
> along with the DUT. This reference structure is the fixture from the
SMA to
> the end of the DUT connected to its mirror image. Using the 2 or 4
port
> measurements of the symmetric 2x thru structure and the measurement of
> the DUT embedded in the middle of this fixture, we can de-embed the
> fixture part and "automagically" extract just the DUT S-parameter
behavioral
> model.
> 
> 
> 
> If you have an interconnect structure, along with the symmetric 2x
thru
> reference structure, and would like some visibility at DesignCon, as
well as
> the measurements done for you, please contact me off line to discuss
this
> opportunity. Due to time and resource limitations, I will select the
first 3
> suitable examples that are submitted.
> 
> 
> 
> I am looking particularly for examples of: Board to board connectors,
coax to
> board connectors, uniform cables, uniform circuit board traces (to get
Dk, Df
> values), circuit board elements like vias, DC blocking caps or flex
structures.
> 
> 
> 
> Just so you know, if the fixturing to the DUT is asymmetric- like an
SMA
> connector to a board, as long as I have symmetric 2x thru structures
created
> for each side separately, I can still de-embed the DUT from an
asymmetric
> thru fixture measurement.
> 
> 
> 
> If you want to participate in this project, contact me off line to
discuss the
> details.
> 
> 
> 
> Thanks and I look forward to hearing from you.
> 
> 
> 
> Of course, this education forum will be open to the public at
DesignCon and
> the presentation will be recorded and made available to anyone
interested in
> this technique. Stay tuned.
> 
> 
> 
> --eric
> 
> 
> 
> *******************************************************
> Dr. Eric Bogatin, Signal Integrity Evangelist Bogatin Enterprises
Setting the
> Standard for Signal Integrity Training No Myths Allowed Webinar Series
Public
> Classes  <http://www.bethesignal.com/> www.BeTheSignal.com
> Blog:  <http://www.bethesignal.com/blog> www.beTheSignal.com/blog
> 26235 W 110th Terr
> Olathe, KS  66061
> e:  <mailto:eric@xxxxxxxxxxxxxxxx> eric@xxxxxxxxxxxxxxx
> v: 913-393-1305   cell: 913-424-4333   f: 913-393-0929
> skype: eric.bogatin
> ***********************************************


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