[SI-LIST] 100,000+ bit transient simulation in seconds
- From: "Chris Herrick" <cherrick@xxxxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Wed, 19 Mar 2008 15:36:15 -0400
Dear SI List,
EDN and Ansoft are hosting a technical webinar tomorrow (3/20) at 11:00
a.m. PST / 2:00 p.m. EST featuring new fast transient and statistical
eye simulation algorithms for rapid analyses of gigabit-speed serial
channels.
Attendees will see:
* Simulation of IBM's BladeCenter(r) technology using VerifEye and
QuickEye
* SIwizard - Automated full-channel simulation for memory applications
* W-elements, S Parameters, R, L, C, values dynamically-linked, on
demand
* Discussion of the fundamental algorithms and comparison to transient
simulation
To register:
http://email.electronicnews.com/cgi-bin2/DM/y/h35p0NT8Wb0Pkt0DWso0EE
Thanks,
Chris Herrick
Abstract:
New Technology for Rapid and Accurate Simulation of Multi-Gigabit Serial
Channels
Modern electronic products use multi-Gigabit serial links to move large
quantities of digital data across today's telecommunication,
high-definition video, gaming, and data storage systems. Engineers
designing links such as 10-Gigabit Ethernet, 8.5 Gb/s Fibre Channel,
InfiniBand, and PCI Express 3.0 demand accurate channel simulation and
modeling to maintain stringent signal quality, jitter and bit error
ratio (BER) performance. When verifying the low BER's required by the
multi-Gigabit protocols, traditional transient simulation techniques are
at odds with the design cycle compression being driven by today's tight
time-to-market windows. There simply isn't enough time to push the
number of bits needed with robust sampling to derive meaningful BER
results. Statistical methods are emerging that allow engineers to
rapidly predict channel level performance with eye diagram plots and BER
curves. This one-hour Web seminar introduces two new simulation
technologies, a fast transient and a statistical tool, that are now
included in Ansoft's circuit simulation engine, Nexxim. The fast
transient tool uses user defined bit streams to produce an eye diagram.
This analysis allows engineers to create controlled stress tests and to
identify specific bit sequences that cause bit errors. The statistical
tool produces both eye diagram plots and BER curves for complete
high-speed channels in minutes. Because these technologies link to
full-wave electromagnetic field solvers and a high capacity circuit
simulation engine, accuracy is not sacrificed for the improved
simulation speed. After a brief introduction to the tools, two channel
examples will be demonstrated. The first channel will serve to highlight
the general capabilities of the simulation technologies. The second will
demonstrate the use of the tool in the pre-layout and post-layout design
of a serialized/de-serialized (SerDes) channel with equalization
developed for IBM's next generation BladeCenter. Finally, a third
technology will be briefly previewed. This powerful new technology
automatically converts three dimensional models into full channel
circuit schematics and launches desired circuit analyses.
------------------------------------------------------------------
To unsubscribe from si-list:
si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field
or to administer your membership from a web page, go to:
//www.freelists.org/webpage/si-list
For help:
si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field
List technical documents are available at:
http://www.si-list.net
List archives are viewable at:
//www.freelists.org/archives/si-list
or at our remote archives:
http://groups.yahoo.com/group/si-list/messages
Old (prior to June 6, 2001) list archives are viewable at:
http://www.qsl.net/wb6tpu
Other related posts:
- » [SI-LIST] 100,000+ bit transient simulation in seconds
