[ibis-quality] Minutes from the 17 Jun 2008 ibis-quality meeting

From: "Mike LaBonte (milabont)" <milabont@xxxxxxxxx>
To: <ibis-quality@xxxxxxxxxxxxx>
Date: Tue, 24 Jun 2008 10:34:10 -0400

Minutes from the 17 Jun 2008 ibis-quality meeting are attached. ARs:

AR: Mike add explanation of OPTIONAL

Mike

Minutes, IBIS Quality Committee

17 Jun 2008

11-12 AM EST (8-9 AM PST)

ROLL CALL
  Adam Tambone
* Anders Ekholm, Ericsson
  Barry Katz, SiSoft
  Benny Lazer
  Benjamin P Silva
  Bob Cox, Micron
* Bob Ross, Teraspeed Consulting Group
  Brian Arsenault
  David Banas, Xilinx
* Eckhard Lenski, Nokia Siemens Networks
  Eric Brock
* Guan Tao, Huawei Technologies
  Gregory R Edlund
  Hazem Hegazy
  Huang Chunxing, Huawei Technologies
  John Figueroa
  John Angulo, Mentor Graphics
  Katja Koller, Nokia Siemens Networks
  Kevin Fisher
  Kim Helliwell, LSI Logic
* Lance Wang, IOMethodology
  Lynne Green
* Mike LaBonte, Cisco Systems
  Mike Mayer, SiSoft
* Moshiul Haque, Micron Technology
  Peter LaFlamme
  Randy Wolff, Micron Technology
  Radovan Vuletic, Qimonda
  Robert Haller, Enterasys
  Roy Leventhal, Leventhal Design & Communications
  Sherif Hammad, Mentor Graphics
  Todd Westerhoff, SiSoft
  Tom Dagostino, Teraspeed Consulting Group
  Kazuyoshi Shoji, Hitachi
  Sadahiro Nonoyama

Everyone in attendance marked by *

NOTE: "AR" = Action Required.

-----------------------MINUTES ---------------------------
Mike LaBonte conducted the meeting.

Call for patent disclosure:

- No one declared a patent.

AR Review:

- Anders create example IBIS file with golden waveforms
  - TBD, maybe week after next

- Mike add explanation of OPTIONAL and make 5.2.9 OPTIONAL
  - First part not done.

New items:

IBIS summit:
- Bob: Lynne Green presented on IBIS model issues
  - Odd looking waveforms, etc.
- Bob: There was an informal meeting with representatives of JEITA
  - A document about IBIS quality was handed out.
  - Users, EDA, chip vendors have distinct problems.
  - About 12 cases have been tested.
    - Used different tools, different users.
  - Sometimes tool setup is a quality factor.
  - Tools can give different results for the same part.
  - Would like to have public test circuits.
  - Need mechanism to report problems which may be either with EDA or chip 
vendor.
- David: This is similar to Anders' request: we need standardized test circuits.
- Mike: IBIS simulators seem to be implemented differently
  - Bob: There are similarities
- Michael Mirmak had given a presentation:
  - SerDes model example with [Test Load]
  - No single buffer has the actual output waveforms
  - model data can not be extracted directly
  - Need to compensate for elements of construction

Bob: Issues have been found using single waveform IBIS models in HSPICE:
- fwf_tune and rwf_tune default settings (0.1) are odd
  - Buffers with only one waveform are compliant
  - 1ns waveform creates 0.1ns second curve
  - ifwf_tune/rwf_tune hould be set to 1.0 for symmetric buffers
- Moshiul: Micron has tested this:
  - Significant difference between different ramp_rwf and ramp_fwf
  - Bob: Default settings will not give good results
- IQ 5.4.5: Output and IO buffers have should have 2 sets of V-T tables
- Mike: Arpad had a presentation on different fixture arrangements

BIRD 109 was passed with "0V" exclusion:
- S_Overshoot is for functional operation.

Continued review of the IBIS Quality Specification:

5.2.13. {LEVEL 2}  [Model Spec] S_Overshoot subparameters complete and match 
data sheet
- Data sheet may not have functional limit, may have only destruction limit
- Moshiul: Vinh max should be the functional limit, for example
  - DDR2 Vinh is 1.15 and max limit is 1.8V
- Anders: repeating a high voltage at a high enough rate depletes charge
  - A vendor had the same limits for DC and AC
- Moshiul: Usually the limit is to avoid forward bias of clamps
- Anders: Do we want "and match data sheet"?
  - Bob: We have to distinguish from measurements, which will have narrower 
ranges
- Moshiul: The data sheet will always have a wider range.

Next meeting:

We will review 5.2.15 next time

24 Jun 2008 11-12 AM EST (8-9 AM PST)

Meeting ended at 12:58 PM Eastern Time.

[ibis-quality] Minutes from the 17 Jun 2008 ibis-quality meeting

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