[hsdd] High-Speed Digital Design Newsletter Via Crosstalk (to Trace)

  • From: "Dr. Howard Johnson" <howie03@xxxxxxxxxx>
  • To: <hsdd@xxxxxxxxxxxxx>
  • Date: Fri, 21 Jan 2005 16:43:25 -0800


               VIA CROSSTALK (TO TRACE)



HIGH-SPEED DIGITAL DESIGN ?  online newsletter  ?
Vol. 8  Issue 01


  Welcome to the New Year. When you receive this
  letter I will be at home, busily preparing new
  material for my public courses in Boston March 7-11,
  and then Austin, TX the week of April 11. The
  Advanced High-Speed Signal Propagation course
  includes a new section on AC coupling, a better
  focus, more examples, less math, and oodles of new
  animations.

  I hope to see you there. If you have already
  attended, please pass this note along to your co-
  workers. Full course descriptions appear at:
  http://www.sigcon.com/seminars.htm

  Next, I'm off to DesignCon in Santa Clara. I'll
  write again when I return, and let you know
  what goodies I find.
______________________________________________________

VIA CROSSTALK (TO TRACE)

Frank Amato at Connexant writes:

  We are having a debate about the minimum separation
  between a differential analog pair and a digital via
  on the same PCB. Can you show the equations to
  calculate the crosstalk between a mult-layer via and
  a differential pair of traces and the corresponding
  explanation?

  Thanks in advance.

______________________________________________________

Dr. Johnson replies:

  Thanks for your interest in High-Speed Digital
  Design.

  Regarding your inquiry, there are two types of
  electrical coupling: inductive (magnetic fields) and
  capacitive (electric-fields).

  First let's deal with magnetic effects. The via has
  a vertical orientation and a trace horizontal
  orientation. Since these two objects carry current
  in perpendicular directions, the magnetic
  interactions null to zero. The same thing happens in
  the case of two traces crossing at right angles?no
  magnetic interaction.

  That leaves us with just electric-field (capacitive)
  effects. The mutual capacitance from the via barrel
  to the nearest trace will create a certain amount of
  unavoidable crosstalk that will not be cancelled by
  the antipodal trace of your differential pair unless
  both traces pass at equal distances from the via
  (i.e., the via "splits" the two traces
  symmetrically). Thus we have two questions: (1) how
  big is the mutual capacitance, and (2) is it a good
  idea to "split" the analog trace with the via. My
  answer to the second question is a firm no. While
  the splitting idea appeals to me intellectually, it
  should not be attempted, as even the slightest
  imperfection in symmetry will result in noticeable
  differential noise coupling. In addition, the
  splitting approach encourages common-mode coupling
  to both traces that, while it might not affect a
  "good" differential receiver, does indeed couple
  digital currents directly into the analog region
  where you do not want them. So how about the first
  question? The answer to that requires some lab
  work...

               *     *     *     *     *

  Today I set up the following experiment involving
  two solid reference planes separated by distance H.

  I placed one signal via in the center of the planes.
  It penetrates completely through the layer stack.
  All interior pads are stripped from this via.

  I placed one stripline trace embedded precisely
  halfway between the planes. The trace extends well
  beyond the via in both directions.

  The experiment uses an HP 4271B LCR meter to measure
  the mutual capacitance between via and trace. Here
  are the particulars:

     The ratio of via diameter to H is 1:3 (e.g., 21-
     mil spacing with 7-mil hole)

     The ratio of trace width to H is 1:4 (typical for
     100-ohm differential striplines)

     The ratio of trace height to H is 1:2 (it's in the
     middle).

     The spacing S from trace to via is variable.

     Pads are stripped from all unused layers on the
     via.

     The trace is 8H long, centered at the via
     location. I verified that the incremental
     contribution of trace length beyond this amount is
     less than my experimental error. The experimental
     error from all sources I estimate at about ten
     percent.

  The system under test uses an air dielectric so I
  can physically move the trace while observing
  changes in mutual capacitance. The trace is
  suspended on dielectric supports of negligible size.
  The system under test is made large enough so I can
  get my hands (and a caliper) inside it to make the
  adjustments.

  You can easily translate my measurements made using
  a large-scale model with an air dielectric into your
  world of practical applications involving tiny
  dimensions and typical pcb dielectric materials. To
  make the translation, you need two rules of scaling.

  (1) Physically scaling the entire model (height,
  width, length, separation, everything) by a scale
  factor k changes the measured capacitance by the
  same scale factor k. This is an exact result from
  Maxwell's equations.

  (2) Filling the interplane cavity with a material
  having a dielectric constant Er changes the
  capacitance by a factor of Er. This is also an exact
  result.

  I present my results assuming a standard height H
  equal to one inch and no dielectric filling. If, for
  example, you use a height H' equal to 0.020 in. with
  Er=4.1, scale my spacing values by the factor 0.020
  and my capacitance values by the factor 0.020*4.1 to
  obtain a new table of results good for your
  application.

  Table 1?Measured values of via-to-trace mutual
  capacitance

  Spacing    Mutual capacitance (pF)

    .238      0.203

    .412      0.119

    .854      0.031

   1.667      0.005

  NOTE: These values assume H=1.00 in. and Er=1.00
  (air). The spacing S appears in inches. Your values
  of H and Er will differ.

  The mid-level position adopted for the stripline
  trace in my experiment is the least favorable
  position for crosstalk. Traces located nearer one
  plane or the other will experience less mutual
  capacitance. Adding pads to the via, or enlarging
  the via barrel diameter, will increase the mutual
  capacitance.

  The impact of via-to-trace mutual capacitance is
  this: a rising edge of height Vs (volts) and
  risetime Tr (s), acting through a mutual capacitance
  of Cm (F) onto a trace having odd-mode impedance Z0
  (ohm) will produce a crosstalk pulse having an
  amplitude A approximately given by:

             A = Vs*(1/2)*(Zodd*Cm/Tr)             [1]

  Example:

     Height H = 0.020
     Spacing S = 0.033 in.
     Er = 4.1

  The ratio S/H equals 5/3, which corresponds to the
  last row of the table. Scale the capacitance in that
  row H=0.020 and Er=4.1 to produce
  Cm=0.005*0.020*4.1=0.00041 pF.

     Assume:

     Vs = 1.0 volt
     Zodd = 50 ohms
     Tr = 100 ps

   A = 1.0*(1/2)*(50 ohms)*(0.00041 pF)/(100 ps)
     = 100 uV  (-80 dB)                            [2]

  Eighty dB is plenty for some applications, not
  enough for others.


               *     *     *     *     *

  The question you did not ask, and one that I find
  most interesting, concerns interactions among vias.
  The electric (capacitive) fields from your digital
  via as they propagate within the reference-plane
  cavity tend to fall off very quickly with distance,
  but magnetic (inductive) fields do not. In the via-
  to-trace problem we are not concerned with inductive
  effects, but in a via-to-via problem we are. Since
  your digital and analog vias both run vertically,
  there is a possibility of interference from that
  source, a subject I will review in the following
  newsletter.

  I hope these comments are helpful to you.

Best Regards,
Dr. Howard Johnson

______________________________________________________

 2005 PUBLIC SEMINARS
   Join us for our Spring 2005 public seminars in
   Boston, MA (March 7-11), Austin, TX (April 11-15)
   and University of Oxford (June 20-24).  A full seminar
   schedule can be found at:
      www.sigcon.com

 Questions & Comments: All students who attend our
   High-Speed Digital Design seminars have the opportunity
   to talk directly to me about signal integrity issues.

 SILAB FILM SERIES
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   integrity topics at SiLab Films. Three titles are
   currently available through Signal Consulting.  For
   a full description of these titles, including pricing
   and order information, visit:
      www.sigcon.com/SiLab/filmsNow.htm

   In addition, we have produced two films with Xilinx
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   of their new high-speed RocketIO transceivers.  Those
   films are available from Xilinx?s On-line  Store at:
      www.xilinx.com

 2005 PRIVATE SEMINARS
   Throughout 2005, I will be teaching "Advanced High-Speed
   Signal Propagation" on-site for many of the same clients
   who?ve hosted "High-Speed Digital Design" during the
   past 10 years. If your company is interested in hosting
   either of these classes in a private venue, for groups
   of 25 or more, please contact Gene at info03@xxxxxxxxxxx

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