[SI-LIST] Measuring signals in the presence of significant noise - part 2
- From: Doug Smith <doug@xxxxxxxxxx>
- To: SI-List <si-list@xxxxxxxxxxxxx>
- Date: Sat, 02 Dec 2006 20:36:51 -0800
Hi All,
In November I published a Technical Tidbit on my website on how not to
measure signal voltages in the presence of significant noise. This
month I show one possible solution - a passive differential probe.
Measuring Signals in the Presence of Severe EMI - Part 2, A
Differential Solution (differential measurement using a passive
differential probe)
Abstract: A passive differential probe can be very useful for making
voltage measurements in the presence of severe interference such as
nearby ESD. In such a situation, active differential probes cannot be
used because of common mode input voltage limitations. Data is
presented to show typical effectiveness of a passive differential probe.
The link to the article is:
http://emcesd.com/tt2006/tt120106.htm
And for the November article:
http://emcesd.com/tt2006/tt110106.htm
Doug
--
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___ _ Doug Smith
\ / ) P.O. Box 1457
========= Los Gatos, CA 95031-1457
_ / \ / \ _ TEL/FAX: 408-356-4186/358-3799
/ /\ \ ] / /\ \ Mobile: 408-858-4528
| q-----( ) | o | Email: doug@xxxxxxxxxx
\ _ / ] \ _ / Website: http://www.dsmith.org
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