[SI-LIST] Re: Stressed-eye tests
- From: steve weir <weirsi@xxxxxxxxxx>
- To: "Radhakrishnan, Nitin (S&T-Student)" <nrc6d@xxxxxxx>
- Date: Thu, 05 Jun 2008 19:55:19 -0700
DCD is equivalent to an offset shift.
Steve.
Radhakrishnan, Nitin (S&T-Student) wrote:
> Hi all,
>
> I am doing stressed eye tests by injecting different models of jitter to
> the input sequence (that is transmitted) and observing the eye-diagram
> at the output. PJ and BUJ can be modeled by using sine waves and
> triangular waves as their histogram models the type of jitter perfectly
> and remains 'uncorrelated' with the input sequence. What is best way to
> model duty cycle distortion (DCD) such that it 'correlates' with the
> data that is being transmitted?=20
>
> Thanks,
> Nitin Radhakrishnan
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- References:
- [SI-LIST] Stressed-eye tests
- From: Radhakrishnan, Nitin (S&T-Student)
Other related posts:
- » [SI-LIST] Stressed-eye tests
- » [SI-LIST] Re: Stressed-eye tests
- [SI-LIST] Stressed-eye tests
- From: Radhakrishnan, Nitin (S&T-Student)