[SI-LIST] Question on Differential S parameters
- From: "Grasso, Charles" <Charles.Grasso@xxxxxxxxxxxx>
- To: "si-list@xxxxxxxxxxxxx" <si-list@xxxxxxxxxxxxx>
- Date: Mon, 4 Apr 2011 14:20:21 -0600
Hello all,
I have a question on how the SDD and SCD series of measurements are made. Never
having actually
performed these measurements I did a bit of reading and am unclear on the
process. What I understand is
(at least from one manufacturer of test equipment) that the 4 x 4 single-ended
S-parameters (S11 to S44)
are measured. A built-in function then converts them to the mixed mode
S-parameters.
My question: For SDD11 are the trace pairs driven with a differential signal
(in the software?).
By the same token for the SDC measurements are the traces driven with a common
signal?
Thanks!
Best Regards
Charles Grasso
Compliance Engineer
Echostar Communications
(w) 303-706-5467
(c) 303-204-2974
(t) 3032042974@xxxxxxxxx<mailto:3032042974@xxxxxxxxx>
(e) charles.grasso@xxxxxxxxxxxx<mailto:charles.grasso@xxxxxxxxxxxx>
(e2) chasgrasso@xxxxxxxxx<mailto:chasgrasso@xxxxxxxxx>
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