Thanks Yuriy, that was great team work between you and our engineers.
For the friends of our community, the key for our effort is to answer two
important questions :
a) How to monitor, in production ,distributions of material properties beyond
trace geometry and impedance
b) From a) how do we create generative channel parameters to meet our ever
tighter channel limits
We used to have something called three sigma tester guard band when I was a
young engineer. Somehow we don't talk like that anymore.
Cheers,
Chris Cheng
Distinguished Technologist , Electrical
Hewlett-Packard Enterprise Company
+1 510 344 4439/ Tel
chris.cheng@xxxxxxx / Email
4209 Technology Dr
Fremont, CA 94538
USA
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx] On ;
Behalf Of Yuriy Shlepnev
Sent: Wednesday, February 08, 2017 12:07 PM
To: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] DesignCon 2017 - material characterization
Hello Everyone,
It was my pleasure to meet some of you SI-list-ers at DesignCon last week. It
was great event. A lot of interest in the material characterization as usual (I
am wondering why :-)). With HPE guys we presented new Gamma-T technique for
dielectric and conductor roughness model identification. It uses time-domain
measurements for the low cost identification process and frequency domain
measurement for the high accuracy identification process on the same simple and
compact test fixtures (hybrid approach). A lot of efforts to validate the
technique and sensitivity investigation - the paper and presentation are now
available at http://www.simberian.com/AppNotes.php - see #2017_01.
Best regards,
Yuriy
Yuriy Shlepnev, Ph.D.
President, Simberian Inc.
2629 Townsgate Rd., Suite #235, Westlake Village, CA 91361, USA Office
+1-702-876-2882; Fax +1-702-482-7903 Cell +1-206-409-2368; Virtual
+1-408-627-7706
Skype: shlepnev
www.simberian.com
Simbeor – Accurate, Productive and Cost-Effective Electromagnetic Signal
Integrity Software
2010 and 2011 DesignVision Award Winner, 2015 Best In Design&Test Finalist
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