1. What are electrical factor to assign/place a test points on the net.(size, type, SI issues) On my board, TP are so small that its hard to solder the Agilent differential probes. 2. Any suggestion on how to probe the DDR3 signals. Agilent DDR3 socket are hard to solder(PCB manufacture issue), so I am avoiding it.. 3. Any PCB guideline for DDR3 interface 4. Any experience or comment on Agilent Automated test application for DDR3 test? 5. To measure a tDS & tDH, why we need to calculate two different slew rate(rising & failing)? 6. Can I consider a derating value for DDR3-1333 tDS/tDH to be same for each data lane? ( I have to measure a data line from each lane to find out the derating value of that lane) 7. Similarly can I consider the derating for tIS/tIH would same all address/cmd line? Cheers, Deepak ________________________________ The information contained in this message may be confidential and legally protected under applicable law. The message is intended solely for the addressee(s). If you are not the intended recipient, you are hereby notified that any use, forwarding, dissemination, or reproduction of this message is strictly prohibited and may be unlawful. If you are not the intended recipient, please contact the sender by return e-mail and destroy all copies of the original message. ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List technical documents are available at: http://www.si-list.net List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu