[ibis-quality] Minutes from the 27 Apr 2010 ibis-quality meeting
- From: "Mike LaBonte (milabont)" <milabont@xxxxxxxxx>
- To: <ibis-quality@xxxxxxxxxxxxx>
- Date: Thu, 29 Apr 2010 19:20:53 -0500
Minutes from the 27 Apr 2010 ibis-quality meeting are attached. Mike
Minutes, IBIS Quality Committee 27 April 2010 11-12 AM EST (8-9 AM PST) ROLL CALL Adam Tambone * Anders Ekholm, Ericsson Barry Katz, SiSoft Benny Lazer Benjamin P Silva Bob Cox, Micron * Bob Ross, Teraspeed Consulting Group Brian Arsenault David Banas, Xilinx * Eckhard Lenski, Nokia Siemens Networks Eric Brock Guan Tao, Huawei Technologies Gregory R Edlund Hazem Hegazy Huang Chunxing, Huawei Technologies John Figueroa John Angulo, Mentor Graphics Katja Koller, Nokia Siemens Networks Kevin Fisher Kim Helliwell, LSI Logic * Lance Wang, IOMethodology Lijun, Huawei Lynne Green, Green Streak Programs * Mike LaBonte, Cisco Systems Mike Mayer, SiSoft * Moshiul Haque, Micron Technology Muniswarareddy Vorugu, ARM Ltd Pavani Jella, TI Peter LaFlamme Randy Wolff, Micron Technology Radovan Vuletic, Qimonda Robert Haller, Enterasys Roy Leventhal, Leventhal Design & Communications Sherif Hammad, Mentor Graphics Tim Coyle, Signal Consulting Group Todd Westerhoff, SiSoft Tom Dagostino, Teraspeed Consulting Group Kazuyoshi Shoji, Hitachi Sadahiro Nonoyama Everyone in attendance marked by * NOTE: "AR" = Action Required. -----------------------MINUTES --------------------------- Mike LaBonte conducted the meeting. Call for opens and IBIS related patent disclosures: - No one declared a patent. - Eckhard European IBIS summit in 2 week - We will have no IQ meeting May 11 AR Review: - none New items: Discussion of Colin Warwick proposal for public IBIS model reviews: - Lance: He is giving a place for vendors to make their models findable - Bob: This is not an official IBIS activity - Mike had tested the Wiki, making a small change to the page Mike showed the IBIS Correlation outline: - We moved the Correlation section ahead of Measurement - We promoted all Correlation subsections to top level - Mike: Since this references an IEEE spec we should look at that Mike showed the draft IEEE correlation specification P1597.1 - Bob: This looks like the document we are trying to write - Mike: We might add only IBIS-specific guidance - Part of this is general, but it goes into frequency domain FSV - Bob: We usually look at low frequency deviations when we examine visually - Mike: Section 3a uses inverse Fourier to get the DC levels AR: Mike ask Antonio Orlandi to join us Mike: We would want test data to work with AR: Moshiul find reference and test data sets for some example model Moshiul: We could get a FOM for IBIS I/V tables against measured I/V Mike: Should we compare IBIS simulation results against a reference? - Bob: We could compare IBIS and HSPICE simulations with a test load circuit Bob: We could ask Orlandi to help analyze it Next meeting will be May 13 Meeting ended at 12:14 PM Eastern Time.
Other related posts:
- » [ibis-quality] Minutes from the 27 Apr 2010 ibis-quality meeting - Mike LaBonte (milabont)