For those who are concerned with model to measurement correlation up to 20-50 GHz, I will provide a free webinar on material parameters identification tomorrow on March 20, 10 AM Pacific Time. Any meaningful electromagnetic signal integrity analysis must start with the identification of broadband models for dielectrics and conductor surface roughness. I will overview possible material models suitable for PCB and packaging problems, and outline how to identify the models with generalized modal S-parameters. You can sign up for the webinar or select another day or subject at http://www.simberian.com/Webinars.php (registration is required). Best regards, Yuriy Yuriy Shlepnev, Ph.D. President, Simberian Inc. 3030 S Torrey Pines Dr. Las Vegas, NV 89146, USA Office +1-702-876-2882 Cell +1-206-409-2368 Skype: shlepnev www.simberian.com ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List forum is accessible at: http://tech.groups.yahoo.com/group/si-list List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu