[SI-LIST] upcoming class with major new test protocol

  • From: "Doug Smith" <doug@xxxxxxxxxx>
  • To: "si-list" <si-list@xxxxxxxxxxxxx>
  • Date: Fri, 30 Jun 2017 17:09:15 -0400

        


Hi All,

I am going to do a three day class at the end of August. Information is at:

http://emcesd.com/#BoulderCity

At the seminar, I will announce and demonstrate a new test method/protocol than 
can predict product degradation in the field leading to premature failure. The 
method and equipment are new, there is nothing like this currently available in 
the industry. The new test method applies to equipment, PCB, and integrated 
circuit design.

Doug







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  • » [SI-LIST] upcoming class with major new test protocol - Doug Smith