Hi All,
I am going to do a three day class at the end of August. Information is at:
http://emcesd.com/#BoulderCity
At the seminar, I will announce and demonstrate a new test method/protocol than
can predict product degradation in the field leading to premature failure. The
method and equipment are new, there is nothing like this currently available in
the industry. The new test method applies to equipment, PCB, and integrated
circuit design.
Doug
------------------------------------------------------------------
To unsubscribe from si-list:
si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field
or to administer your membership from a web page, go to:
//www.freelists.org/webpage/si-list
For help:
si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field
List forum is accessible at:
http://tech.groups.yahoo.com/group/si-list
List archives are viewable at:
//www.freelists.org/archives/si-list
Old (prior to June 6, 2001) list archives are viewable at:
http://www.qsl.net/wb6tpu
