[SI-LIST] near and far end crosstalk data derived from IEC test

  • From: Doug Smith <doug@xxxxxxxxxx>
  • To: SI-List <si-list@xxxxxxxxxxxxx>
  • Date: Thu, 02 Jun 2005 22:55:36 -0700

Hi All,

I have been writing again. This time my Technical Tidbit is an 
analysis of the IEC 61000-4-4 Capacitive Clamp and would normally be 
considered an EMC article. However, the example is one of a 50 Ohm 
transmission line (the Capacitive Clamp) coupled to another conductor. 
The risetimes are 5 ns and the length of coupling is one meter, but if 
you scale to 100 to 200 ps risetimes and lengths of 1 or 2 cm, you get 
similar results depending on how close the coupling between the path 
and the transmission line is. The Capacitive Clamp is fairly strong 
coupling. It makes an interesting scaled transmission line example.

Abstract: Analysis is performed of the currents injected by the IEC 
61000-4-4 Capacitive Clamp using current probes. Surprising results of 
the current measurements indicate that the Capacitive Clamp is 
directional and sends more energy to the support equipment (AUX) than 
to the equipment under test (EUT)! The directional property of the 
Capacitive Clamp also leads to a common lab error where significantly 
more energy is applied to the EUT if the clamp is not properly 
connected, potentially causing compliant equipment to fail the test.

The article link is the picture of the Capacitive Clamp at the bottom 
of my home page at http://emcesd.com .

Doug
-- 
-------------------------------------------------------
     ___          _       Doug Smith
      \          / )      P.O. Box 1457
       =========          Los Gatos, CA 95031-1457
    _ / \     / \ _       TEL/FAX: 408-356-4186/358-3799
  /  /\  \ ] /  /\  \     Mobile:  408-858-4528
|  q-----( )  |  o  |    Email:   doug@xxxxxxxxxx
  \ _ /    ]    \ _ /     Website: http://www.dsmith.org
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