[SI-LIST] electrical characterization of substrates at 60 GHz
- From: 최광성 <kschoi@xxxxxxxxxx>
- To: si-list@xxxxxxxxxxxxx
- Date: Wed, 13 Oct 2004 10:15:44 +0900
Dear experts;
I am looking for the measurement techniques of accurate electrical
characterization of ceramics (dielectric const. Loss tangent) at 60 GHz.
Currently, I consider the microstrip line T-resonator technique.
I wonder this technique is applicable to 60 GHz frequency.
What is the disadvantage of this method at such a high frequency and
is there any more reliable method?
Thanks...
Kwang-Seong Choi
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