[SI-LIST] Wafer probing on Al pads
- From: Brian Frank <frankb@xxxxxxxxxxxxx>
- To: SI-LIST <si-list@xxxxxxxxxxxxx>
- Date: Tue, 11 Feb 2003 13:45:13 -0500 (EST)
Hi,
I'm doing on-wafer measurements of 10-20 GHz silicon circuits. I've found
that the repeatability of the measurements is poor due to aluminum oxide
formation on the pads.
Cascade Microtech and Karl Suss both offer probes which they claim work
well with aluminum pads (the Infinity Probe, and the "Z" probe,
respectively). Does anyone have experience with either of these probes,
or have other suggestions for other suitable wafer probes?
Thanks,
Brian
--
B. Frank, P.Eng.
Assistant Professor
Department of Electrical and Computer Engineering
Tel: 613.533.3063 |||| F: 613.533.6615
------------------------------------------------------------------
To unsubscribe from si-list:
si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field
or to administer your membership from a web page, go to:
//www.freelists.org/webpage/si-list
For help:
si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field
List archives are viewable at:
//www.freelists.org/archives/si-list
or at our remote archives:
http://groups.yahoo.com/group/si-list/messages
Old (prior to June 6, 2001) list archives are viewable at:
http://www.qsl.net/wb6tpu
Other related posts:
