Istvan
This (your process outline below) sounds a lot like about what we are trying to
tackle with NISM (Non-Invasive Stability Measurement) and the trials and
tribulations we have had making SPICE models for regulators.
Please see the paper "Why Regulators Need Modeling, Testing, and Analysis" on
http://www.aeng.com/design_analysis.htm or email be directly for more details ;
on the SPICE model process, but there is zero chance that a general or generic
SPICE model can be developed for VRMs (as you point out the secondary effects
are a killer). From our experience making models for almost all of the analog
IC vendors I can tell you that linear regulator behavior is so nonlinear over
their operating conditions that it is almost impossible to even make a macro
model, let along something 'generic'. In most cases, the transistor level model
is needed to emulate the control loop accurately. While the vendors give us the
transistor level models for the parts we model, they will not usually do that
for end customers. I will not say that the problem is intractable, certainly
the PDN modeling is challenging in itself, but unless the operating point of
the VRM operation can be narrowed down to a slim window, modeling the VRM
without the transistor level model is a tall and very time-consuming order.
As I said I am happy to discuss our many experiences with SPICE modeling of
VRMs but its better done on the phone or in person.
This is a great topic for the Power Integrity Meet Up at Designcon (which Steve
Sandler and I will be at).
Charles Hymowitz - Managing Director
AEi Systems, LLC
Charles@xxxxxxxx
(310) 216-1144
(310) 863-8034 (M)
http://www.aeng.com – Analytical Heavy Lifting
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx] On ;
Behalf Of istvan.novak@xxxxxxxxxxx
Sent: Wednesday, January 13, 2016 6:19 AM
To: buenoshun@xxxxxxxxx; si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: VRM bode plot transformation into output imp profile
Hi Istvan,
You are not alone with this challenge, but as usual= , the answer is "it
depends", and there is no single generic= answer to this question that could
fit the very wide spectrum of circ= uits and applications. The first thing to
keep in
mind:
as Lee o= ften reminds this list, you get what you pay for.
Going from loo= p gain to closed-loop output impedance: the theory is there.
You= dont even need to pick up one of the many books on DC-DC converter de=
signs; you can apply simple calculations of an amplifier block with a =
feedback. However, you have to set the expectations right: if you think that
your simple averaged model may not capture all of the effects,= you should not
think that using the Bode plot predicted by a vendor t= ool (which most of them
are also averaged, and capture only the first-= order
effects) will give you the details you missed in your simple mod= el; it
willnot.
The biggest challenge in these days is coming f= rom all of the secondary
effects that are very hard to model. Ma= ny years ago converters tended to be
stand-alone, well-isolated blocks= , where source and load conditions had less
influence on the performan= ce. As we tend to reduce those input/output
barriers to achieve = cost and size reduction, you will find that many
converters today will= show enough 'transparency' that your output impedance
also depends on= the source impedance. Also, if you DO count on any of the
nonlinearfunctions of modern controllers, you should not expect to capture itw=
ith a simple SPICE model. The selection of control-loop type als= o makes a big
difference: some (like current-mode control) are more fr= iendly to simple
modeling, because they tend to be less sensitive to s= econd-order effects.
Some others, like constant ON time and hysteretic= -type controllers have a
tendency to be much more sensitive to things = like layout details, which are
much harder to capture in simple models= . Sometimes the same exact circuit,
even if you literally move t= he same components, may perform very differently
dependent on the boar= d stackup and small layout details.
Some of these challenges wer= e described in past publications, for instance
http://www.electrical-integrity.com/Paper_download_files=
/DC12_11-MP2.pdf[1]
http://www.electrical-integrity.com/Paper_downl=
oad_files/DC15_11_FR1_Paper_ImpactofRegulatorSense_point.pdf[2]
(this= second paper described second-order scenarios that should be easy to =
simulate if you have the proper averaged model for the converter.
At D= esignCon 2016 you will also find multiple talks that touch on this
su=bject and we can chat if you attend.
We all have the desire= to do pre-layout and post-layout simulations to capture
potential pro= blems before we build our boards. In my experience though,
unles= s we can afford significant overdesign, you should always allow for it=
erations and design changes after your first build, and the changes shouldbe
based on actual validation. This of course refers to cases wh= en the
performance details matter; but otherwise why would you want to= do more
accurate simulations before you build the board?
R= egards,
Istvan Novak
Oracle
&nb= sp; On 01/13/16, Istvan Nagy<buenoshun@xxxxxxxxx> wrote:= Hi,
This post is about theories on VRM modelling.
For power integrity analysis ideally we should combine the fre=
quency-responses of the VRM (output impedance profile), all the capac= itors,
the power planes and maybe some properties of the chips (pin i= nductance,
package decaps..). I would do this combined simulation in AC small signal mode
in SPICE or ADS or similar. The model of the capacitor= s is easily simulated
(3-element ESL/ESR/C), the power planes can be = extracted with 2.5D-3D EM
simulators into touchstone files. But, the = VRM model is what I find more
problems with. Older publications sugge= sted 2-element or 4-element lumped
models that are probably not accur= ate at all, especially for modern digital
controllers. Building an &q= uot;averaged model" would notbe possible for me,
as I am not wo= rking at the VRM-chip companies. I tried to
make estimated models for= VRM, but they are probably very inaccurate, as I
cannot model all th= e effects in the VRM with my simple spice models:
http://www.buenos.extra.hu/download/QUCS_PowerIntegrity= -doc.pdf[3] So, I ;
thought we could get more accurate VRM models for p= ower delivery system
impedance profile simulation by transforming the= bode plot into an impedance
profile. I think they basically describe= the same thing but in different ways,
closed vs open loop and curren= t vs voltage source being used. Then
impedance/frequency (Z-parameter= ) plots can be transformed into
S-parameter/frequency plots (touchsto= ne file) in easy and known ways. Then
these touchstone files can be p= laced as components in AC simulation is
QUCS-spice or Agilent-ADS.All VRM chip vendors provide simulation tools to
generate "OPEN loo= p GAIN (bode plot)". So we can get this plot for every
project e= asily. Maybe we could transform this plot into a "CLOSED loop ou=
tput IMPEDANCE profile".
Most/any chip vendors don't provide too= ls to generate the impedance profile,
I don't know enough about the i= nternals of each VRM to build accurate models
that I can simulate dir= ectly for output impedance, but Bode tools are common
and easily avai= lable.
The problem is, I have no idea how to transform one into the ot= her, and no
idea whether it is possible at all. That's my missing lin= k.
"OPEN loop GAIN (bode plot)" =3D=3D[??]=3D=3D> "C= LOSED loop output IMPEDANCE
profile".
What I am looki= ng for is a reusable model, equations or tools, so for every
rail in = every project I could simulate the PI quickly.
Any comments?
Is i= t possible?
Regards,
Istvan Nagy
Board/hardware design= engineer
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