> A couple of Intel colleagues presented a method for doing so at > DesignCon 2010: "SET2DIL: Method to Derive Differential Insertion > Loss from Single-Ended TDR/TDT Measurements". You can find > more information here: Thanks a lot for poiting out the interesting article. I found a link to it and am printing http://www.designcon.com/2010/DCPDFs/12-WP1_Jeff_Loyer.pdf Regards, Alfred ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List technical documents are available at: http://www.si-list.net List archives are viewable at: //www.freelists.org/archives/si-list Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu