[SI-LIST] Tutorial at the IEEE EPEP conference
- From: "Pratt, Gary" <gary_pratt@xxxxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Thu, 12 Oct 2006 16:39:15 -0400
SHORT COURSE 3 - SI Modeling Alternatives and Novel Applications of
IBIS/IEEE AMS
I would like to invite anyone interested to attend the short course on
IBIS 4.1 and AMS modeling being delivered at the IEEE EPEP conference
the week after next. The tutorial will cover the IBIS 4.1 multi-lingual
model extensions, detailed syntax of IEEE 1076.1, a case study of
modeling a high-speed SERDES, and examples of other novel uses of
IBIS4.1-AMS including DFE, CDR, and automated DDR2 measurement.
Session VI - Automated Timing and Electrical Analysis of a DDR2 memory=20
Also, there will be a more detailed presentation on using AMS models to
perform automated DDR2 analysis. The paper will show how
IBIS4.1/IEEE1076.1 can automatically perform 25 different electrical and
timing measurements on the data and strobe (on strobe edge), and can
provide a complete pass/fail analysis (or can be customized to output
any information required).=20
More information is available at
http://www.epep.org/technicalprogram.html. =20
Gary L. Pratt, P.E.
Mentor Graphics
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