Experts, There are numerous silicon parameters that can be skewed that will affect the strength of the silicon. There are parameters that represent oxidation, channel length, doping, etc. Question is, do these parameters affect P and N type transistors differently? In our simulations, we skew 'process' to either fast or slow (or maybe typical). In reality, is it possible to have fast N-type ans slow P-type or vice versa? Why? What process parameter combinations could cause this to happen? Do we need to cover this possibility in simulation? Thanks, -James __________________________________________________ Do You Yahoo!? Tired of spam? Yahoo! Mail has the best spam protection around http://mail.yahoo.com ------------------------------------------------------------------ To unsubscribe from si-list: si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field or to administer your membership from a web page, go to: //www.freelists.org/webpage/si-list For help: si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field List FAQ wiki page is located at: http://si-list.org/wiki/wiki.pl?Si-List_FAQ List technical documents are available at: http://www.si-list.org List archives are viewable at: //www.freelists.org/archives/si-list or at our remote archives: http://groups.yahoo.com/group/si-list/messages Old (prior to June 6, 2001) list archives are viewable at: http://www.qsl.net/wb6tpu