[SI-LIST] Skewed Silicon Parameters

  • From: <james_r_jones@xxxxxxxxx>
  • To: si-list@xxxxxxxxxxxxx
  • Date: Tue, 7 Feb 2006 14:51:46 -0800 (PST)

Experts,

There are numerous silicon parameters that can be
skewed that will affect the strength of the silicon. 
There are parameters that represent oxidation, channel
length, doping, etc.  

Question is, do these parameters affect P and N type
transistors differently?  

In our simulations, we skew 'process' to either fast
or slow (or maybe typical).  In reality, is it
possible to have fast N-type ans slow P-type or vice
versa?  Why?  What process parameter combinations
could cause this to happen?  Do we need to cover this
possibility in simulation?

Thanks,
-James

__________________________________________________
Do You Yahoo!?
Tired of spam?  Yahoo! Mail has the best spam protection around 
http://mail.yahoo.com 
------------------------------------------------------------------
To unsubscribe from si-list:
si-list-request@xxxxxxxxxxxxx with 'unsubscribe' in the Subject field

or to administer your membership from a web page, go to:
//www.freelists.org/webpage/si-list

For help:
si-list-request@xxxxxxxxxxxxx with 'help' in the Subject field

List FAQ wiki page is located at:
                http://si-list.org/wiki/wiki.pl?Si-List_FAQ

List technical documents are available at:
                http://www.si-list.org

List archives are viewable at:     
                //www.freelists.org/archives/si-list
or at our remote archives:
                http://groups.yahoo.com/group/si-list/messages
Old (prior to June 6, 2001) list archives are viewable at:
                http://www.qsl.net/wb6tpu
  

Other related posts: