[SI-LIST] Re: Simulating measured data in ADS
- From: <robert_sleigh@xxxxxxxxxxx>
- To: <Ravinder.Ajmani@xxxxxxxxxxxxxx>, <vhdlguy@xxxxxxxxx>
- Date: Fri, 5 Feb 2010 18:05:27 -0700
Greetings,
I would be happy to work with you to determine why you're having
difficulty correlating ADS and PLTS measurements from the same
S-Parameter file (generated from the 86100C).
If interested, please reply to me directly.
Best regards,
Rob Sleigh
Digital Test Division - Scopes
Agilent Technologies, Inc.
-----Original Message-----
From: si-list-bounce@xxxxxxxxxxxxx [mailto:si-list-bounce@xxxxxxxxxxxxx]
On Behalf Of Ravinder.Ajmani@xxxxxxxxxxxxxx
Sent: Friday, February 05, 2010 4:31 PM
To: Kay Ira
Cc: si-list@xxxxxxxxxxxxx
Subject: [SI-LIST] Re: Simulating measured data in ADS
I have used 86100C to extract S-parameters of an interconnect, but was
not
able to run the generated touchstone file in my simulator due to
causality
issues. I believe VNA is a better tool for S-parameter extraction.
Regards, Ravinder
Server PCB Development
Hitachi Global Storage Technologies
Email: Ravinder.Ajmani@xxxxxxxxxxxxxx
Kay Ira <vhdlguy@xxxxxxxxx>
Sent by: si-list-bounce@xxxxxxxxxxxxx
02/05/2010 03:22 PM
To
si-list@xxxxxxxxxxxxx
cc
Subject
[SI-LIST] Simulating measured data in ADS
Hi,
Does any one have any experience using the method below to characterize
an
interconnect?
1. Use an 86100C Agilent scope with one or two TDR modules to take
measurements under PLTS control.
2. Use PLTS to export a Touchstone file.
3. Use ADS transient or channel simulator to generate an eye diagram
using
the imported Touchstone file.
I have gone through this path and I cannot get a reasonable correlation
between the eye diagram synthesized by the PLTS and the one generated
by
the ADS simulator. The stimulus sources in PLTS and ADS are identical in
terms of amplitude, rise time, Bit pattern and rate etc.
I have seen a number of papers where this method is used successfully
except that a VNA was used to measure the data.
Regards,
Keyvan Irani
Raytheon
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