[SI-LIST] Re: Shoots
- From: "Ingraham, Andrew" <a.ingraham@xxxxxxxx>
- To: <si-list@xxxxxxxxxxxxx>
- Date: Tue, 11 May 2004 10:55:05 -0400
> 2) What are some of the things that can go wrong if the shoots are too =
> large?
> 2a) Is turning on the protection diodes the only concern?
>
> >gate oxide breakdown and electromigration, see above.
There may be others. One that I've heard about, is "hot carrier" effect.
I think it's another long-term reliability problem (like electromigration),
where no functional damage might occur if you exceed the limit, but the
part's lifetime is degraded. This makes it a matter of statistics and
probabilities, and one where the theory and the empirical evidence may not
be entirely in step.
Andy
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